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Journal articles

Lepkowski DL; Grassman TJ; Boyer JT; Chmielewski DJ; Yi C; Juhl MK; Soeriyadi AH; Western N; Mehrvarz H; Römer U; Ho-Baillie A; Kerestes C; Derkacs D; Whipple SG; Stavrides AP; Bremner SP; Ringel SA, 2021, '23.4% monolithic epitaxial GaAsP/Si tandem solar cells and quantification of losses from threading dislocations', Solar Energy Materials and Solar Cells, vol. 230, pp. 111299 - 111299, http://dx.doi.org/10.1016/j.solmat.2021.111299

Sun C; Zhu Y; Juhl M; Yang W; Rougieux F; Hameiri Z; Macdonald D, 2021, 'The role of charge and recombination-enhanced defect reaction effects in the dissociation of FeB pairs in p-type silicon under carrier injection', Physica Status Solidi - Rapid Research Letters, http://dx.doi.org/10.1002/pssr.202000520

Zhu Y; Juhl MK; Coletti G; Hameiri Z, 2021, 'Erratum to “Reassessments of minority carrier traps in silicon with photoconductance decay measurements”', IEEE Journal of Photovoltaics, vol. 11, pp. 241 - 242, http://dx.doi.org/10.1109/jphotov.2020.3031381

Rougieux FE; Sun C; Juhl M, 2020, 'Light-induced-degradation defect independent of the boron concentration: Towards unifying admittance spectroscopy, photoluminescence and photoconductance lifetime spectroscopy results', Solar Energy Materials and Solar Cells, vol. 210, http://dx.doi.org/10.1016/j.solmat.2020.110481

Kunz O; Evans RJ; Juhl MK; Trupke T, 2020, 'Understanding partial shading effects in shingled PV modules', Solar Energy, vol. 202, pp. 420 - 428, http://dx.doi.org/10.1016/j.solener.2020.03.032

Bhoopathy R; Kunz O; Juhl M; Trupke T; Hameiri Z, 2020, 'Outdoor photoluminescence imaging of solar panels by contactless switching: Technical considerations and applications', Progress in Photovoltaics: research and applications, http://dx.doi.org/10.1002/pip.3216

Zafirovska I; Juhl MK; Ciesla A; Evans R; Trupke T, 2019, 'Low temperature sensitivity of implied voltages from luminescence measured on crystalline silicon solar cells', Solar Energy Materials and Solar Cells, vol. 199, pp. 50 - 58, http://dx.doi.org/10.1016/j.solmat.2019.04.009

Zhu Y; Juhl MK; Coletti G; Hameiri Z, 2019, 'Reassessments of minority carrier traps in silicon with photoconductance decay measurements', IEEE Journal of Photovoltaics, vol. 9, pp. 652 - 652, http://dx.doi.org/10.1109/jphotov.2019.2903584

Paduthol A; Juhl MK; Nogay G; Löper P; Ingenito A; Trupke T, 2018, 'Impact of different capping layers on carrier injection efficiency between amorphous and crystalline silicon measured using photoluminescence', Solar Energy Materials and Solar Cells, vol. 187, pp. 55 - 60, http://dx.doi.org/10.1016/j.solmat.2018.07.016

Paduthol A; Juhl MK; Nogay G; Löper P; Trupke T, 2018, 'Measuring carrier injection from amorphous silicon into crystalline silicon using photoluminescence', Progress in Photovoltaics: Research and Applications, vol. 26, pp. 968 - 973, http://dx.doi.org/10.1002/pip.3042

Zhu Y; Heinz F; Juhl M; Schubert M; Tropke T; Hameiri Z, 2018, 'Photoluminescence imaging at uniform excess carrier density using adaptive nonuniform excitation', IEEE Journal of Photovoltaics, vol. 8, pp. 1787 - 1787, http://dx.doi.org/10.1109/JPHOTOV.2018.2869541

Dumbrell R; Juhl MK; Trupke T; Hameiri Z, 2018, 'Extracting metal contact recombination parameters from effective lifetime data', IEEE Journal of Photovoltaics, vol. 8, pp. 1413 - 1420, http://dx.doi.org/10.1109/JPHOTOV.2018.2861761

Chung D; Mitchell B; Juhl MK; Abbott M; Trupke T, 2018, 'Lifetime imaging on silicon bricks using the ratio of photoluminescence images with different excitation wavelengths', IEEE Journal of Photovoltaics, vol. 8, pp. 943 - 951, http://dx.doi.org/10.1109/JPHOTOV.2018.2831449

Juhl MK; Western N; Bremner S, 2018, 'Hydrogen Passivation for Estimating the Bulk Lifetime of Bare Silicon Wafers', Physica Status Solidi - Rapid Research Letters, vol. 12, http://dx.doi.org/10.1002/pssr.201800093

Heinz FD; Zhu Y; Hameiri Z; Juhl MK; Trupke T; Schubert MC, 2018, 'The principle of adaptive excitation for photoluminescence imaging of silicon: Theory', Physica Status Solidi - Rapid Research Letters, vol. 12, pp. 1800137 - 1800137, http://dx.doi.org/10.1002/pssr.201800137

Teal A; Mitchell B; Juhl MK, 2018, 'Improved spatial resolution of luminescence images acquired with a silicon line scanning camera', Journal of Applied Physics, vol. 123, http://dx.doi.org/10.1063/1.4986803

Paduthol A; Juhl MK; Trupke T, 2018, 'Correcting the Effect of LED Spectra on External Quantum Efficiency Measurements of Solar Cells', IEEE Journal of Photovoltaics, vol. 8, pp. 559 - 564, http://dx.doi.org/10.1109/JPHOTOV.2017.2787022

Zhu Y; Juhl M; Coletti G; Hameiri Z, 2018, 'On the transient negative photoconductance in n-type Czochralski silicon', IEEE Journal of Photovoltaics, vol. 8, pp. 421 - 427, http://dx.doi.org/10.1109/JPHOTOV.2017.2784679

Paduthol A; Juhl MK; Trupke T, 2018, 'Addressing limitations of photoluminescence based external quantum efficiency measurements', Journal of Applied Physics, vol. 123, http://dx.doi.org/10.1063/1.5004193

Bhoopathy R; Kunz O; Juhl M; Trupke T; Hameiri Z, 2018, 'Outdoor photoluminescence imaging of photovoltaic modules with sunlight excitation', Progress in Photovoltaics: Research and Applications, vol. 26, pp. 69 - 73, http://dx.doi.org/10.1002/pip.2946

Iskra Z; Juhl MK; Weber JW; Wong J; Trupke T, 2017, 'Detection of Finger Interruptions in Silicon Solar Cells Using Line Scan Photoluminescence Imaging', IEEE Journal of Photovoltaics, vol. 7, pp. 1496 - 1502, http://dx.doi.org/10.1109/JPHOTOV.2017.2732220

Wang L; Pollard ME; Klaus Juhl M; Conrad B; Soeriyadi A; Li D; Lochtefeld A; Gerger A; Bagnall DM; Barnett A; Perez-Wurfl I, 2017, 'Spectral response of steady-state photoluminescence from GaAs1-xPx layers grown on a SiGe/Si system', Applied Physics Letters, vol. 111, http://dx.doi.org/10.1063/1.4986134

Juhl MK; Abbott MD; Trupke T, 2017, 'Relative External Quantum Efficiency of Crystalline Silicon Wafers from Photoluminescence', IEEE Journal of Photovoltaics, vol. 7, pp. 1074 - 1080, http://dx.doi.org/10.1109/JPHOTOV.2017.2697313

Zhu Y; Le Gia QT; Juhl MK; Coletti G; Hameiri Z, 2017, 'Application of the Newton–Raphson method to lifetime spectroscopy for extraction of defect parameters', IEEE Journal of Photovoltaics, vol. 7, pp. 1092 - 1092, http://dx.doi.org/10.1109/JPHOTOV.2017.2695666

Dumbrell R; Juhl MK; Trupke T; Hameiri Z, 2017, 'Comparison of terminal and implied open-circuit voltage measurements', IEEE Journal of Photovoltaics, vol. 7, pp. 1376 - 1383, http://dx.doi.org/10.1109/JPHOTOV.2017.2729889

Zhu Y; Juhl MK; Trupke T; Hameiri Z, 2017, 'Photoluminescence imaging of silicon wafers and solar cells with spatially inhomogeneous illumination', IEEE Journal of Photovoltaics, vol. 7, pp. 1087 - 1087, http://dx.doi.org/10.1109/JPHOTOV.2017.2690875

Juhl MK; Trupke T, 2016, 'The impact of voltage independent carriers on implied voltage measurements on silicon devices', Journal of Applied Physics, vol. 120, http://dx.doi.org/10.1063/1.4965698

Hameiri Z; Mahboubi Soufiani A; Juhl MK; Jiang LC; Huang FZ; Cheng YB; Kampwerth H; Weber J; Green M; Trupke T, 2015, 'Photoluminescence and electroluminescence imaging of perovskite solar cells', Progress in Photovoltaics: Research and Applications, vol. 23, pp. 1697 - 1705, http://dx.doi.org/10.1002/pip.2716

Juhl MK; Trupke T; Abbott M; Mitchell B, 2015, 'Spatially Resolved Absorptance of Silicon Wafers from Photoluminescence Imaging', IEEE Journal of Photovoltaics, vol. 5, pp. 1840 - 1843, http://dx.doi.org/10.1109/JPHOTOV.2015.2470095

Ruhle K; Juhl MK; Abbott MD; Reindl LM; Kasemann M, 2015, 'Impact of Edge Recombination in Small-Area Solar Cells with Emitter Windows', IEEE Journal of Photovoltaics, vol. 5, pp. 1067 - 1073, http://dx.doi.org/10.1109/JPHOTOV.2015.2434597

Rühle K; Juhl MK; Abbott MD; Kasemann M, 2015, 'Evaluating Crystalline Silicon Solar Cells at Low Light Intensities Using Intensity-Dependent Analysis of I-V Parameters', IEEE Journal of Photovoltaics, vol. 5, pp. 926 - 931, http://dx.doi.org/10.1109/JPHOTOV.2015.2395145

Chan C; Abbott M; Hallam B; Juhl M; Lin D; Li Z; Li Y; Rodriguez J; Wenham S, 2015, 'Edge isolation of solar cells using laser doping', Solar Energy Materials and Solar Cells, vol. 132, pp. 535 - 543, http://dx.doi.org/10.1016/j.solmat.2014.10.002

Augarten Y; Trupke T; Lenio M; Bauer J; Weber JW; Juhl M; Kasemann M; Breitenstein O, 2013, 'Calculation of quantitative shunt values using photoluminescence imaging', Progress in Photovoltaics: Research and Applications, vol. 21, pp. 933 - 941, http://dx.doi.org/10.1002/pip.2180

Juhl M; Chan C; Abbott MD; Trupke T, 2013, 'Anomalously high lifetimes measured by quasi-steady-state photoconductance in advanced solar cell structures', Applied Physics Letters, vol. 103, pp. - - -, http://dx.doi.org/10.1063/1.4840337

Chan CE; Abbott MD; Juhl MK; Hallam BJ; Xiao B; Wenham SR, 2013, 'Assessing the Performance of Surface Passivation Using Low-Intensity Photoluminescence Characterization Techniques', IEEE Journal of Photovoltaics, vol. 4, pp. 1 - 7, http://dx.doi.org/10.1109/JPHOTOV.2013.2282739

Mitchell B; Juhl M; Green MA; Trupke T, 2013, 'Full spectrum photoluminescence lifetime analyses on silicon bricks', IEEE journal of photovoltaics, vol. 3, pp. 962 - 969, http://dx.doi.org/10.1109/JPHOTOV.2013.2259894

Conference Papers

Zhou Z; Vaqueiro-Contreras M; Juhl MK; Rougieux F, 2021, 'Electronic Properties of the Boron-oxygen Defect Precursor in Silicon', in Conference Record of the IEEE Photovoltaic Specialists Conference, IEEE, pp. 269 - 271, presented at 2021 IEEE 48th Photovoltaic Specialists Conference (PVSC), 20 June 2021 - 25 June 2021, http://dx.doi.org/10.1109/PVSC43889.2021.9519027

Kunz O; Rey G; Juhl MK; Trupke T, 2021, 'High Throughput Outdoor Photoluminescence Imaging via PV String Modulation', in Conference Record of the IEEE Photovoltaic Specialists Conference, IEEE, pp. 346 - 350, presented at 2021 IEEE 48th Photovoltaic Specialists Conference (PVSC), 20 June 2021 - 25 June 2021, http://dx.doi.org/10.1109/PVSC43889.2021.9519109

Lepkowski DL; Kasher T; Boyer JT; Blumer ZH; Yi C; Juhl MK; Soeriyadi AH; Mehrvarz H; Romer U; Ho-Baillie A; Bremner SP; Ringel SA; Grassman TJ, 2021, 'Recent Advances in GaAsP/Si Top Cell Enabling 27% Tandem Efficiency', in Conference Record of the IEEE Photovoltaic Specialists Conference, IEEE, pp. 1644 - 1646, presented at 2021 IEEE 48th Photovoltaic Specialists Conference (PVSC), 20 June 2021 - 25 June 2021, http://dx.doi.org/10.1109/PVSC43889.2021.9518768

Lepkowski DL; Boyer JT; Yi C; Soeriyadi AH; Blumer ZH; Juhl MK; Derkacs D; Kerestes C; Stavrides A; Mehrvarz H; Ho-Baillie AWY; Bremner S; Ringel SA; Grassman TJ, 2020, 'Loss Analysis and Design Strategies Enabling >23% GaAsP/Si Tandem Solar Cells', in Conference Record of the IEEE Photovoltaic Specialists Conference, pp. 1884 - 1886, http://dx.doi.org/10.1109/PVSC45281.2020.9300787

Rougieux F; Sun C; Juhl M, 2020, 'The Boron-Oxygen Defect: Does its Concentration Really Depends on the Boron/Dopant Concentration?', in Conference Record of the IEEE Photovoltaic Specialists Conference, pp. 2522 - 2524, http://dx.doi.org/10.1109/PVSC45281.2020.9300431

Bhoopathy R; Kunz O; Juhl M; Trupke T; Hameiri Z, 2019, 'A simplified contactless method for outdoor photoluminescence imaging', Chicago, USA, presented at 46th IEEE Photovoltaic Specialists Conference, Chicago, USA, 16 June 2019 - 21 June 2019

Bhoopathy R; Kunz O; Juhl M; Trupke T; Hameiri Z, 2018, 'Photoluminescence imaging of field deployed modules using contactless switching', Sydney, presented at Asia Pacific Solar Research Conference, Sydney, 04 December 2018

Juhl MK; Heinz FD; Coletti G; MacDonald D; Rougieux FE; Schindle F; Niewelt T; Schubert MC, 2018, 'An Open Source Based Repository for Defects in Silicon', in 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC, pp. 328 - 332, http://dx.doi.org/10.1109/PVSC.2018.8547621

Paduthol A; Juhl MK; Nogay G; Löper P; Ingenito A; Trupke T, 2018, 'Carrier injection from amorphous silicon into crystalline silicon determined with photoluminescence', in 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC, pp. 3746 - 3750, http://dx.doi.org/10.1109/PVSC.2018.8547295

Zafirovska I; Juhl MK; Trupke T, 2018, 'Comparison of Line Scan Luminescence Imaging Techniques for Defect Characterisation in Crystalline Silicon Solar Modules', in 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC, pp. 1364 - 1369, http://dx.doi.org/10.1109/PVSC.2018.8547434

Evans R; Juhl M; Chung D; Mitchell B; Altermatt PP; Trupke T, 2018, 'Influence of Multicrystalline Silicon Ingot Properties on the Fill Factor of PERC Solar Cells', in 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC, pp. 62 - 65, http://dx.doi.org/10.1109/PVSC.2018.8547452

Paduthol A; Juhl MK; Trupke T, 2018, 'Limitations of photoluminescence based external quantum efficiency measurements', in 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC, pp. 2224 - 2228, http://dx.doi.org/10.1109/PVSC.2018.8548179

Western NJ; Juhl MK; Bremner SP, 2018, 'Simple, Robust Hydrogen Passivation of Bare Silicon for Estimating Bulk Lifetime of Silicon Wafers', in 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC, pp. 2252 - 2255, http://dx.doi.org/10.1109/PVSC.2018.8547614

Bhoopathy R; Kunz O; Juhl MK; Trupke T; Hameiri Z, 2018, 'Photoluminescence based characterization techniques for photovoltaic modules in the field', in Photoluminescence based characterization techniques for photovoltaic modules in the field, 28th Annual NREL Silicon Workshop, Winter Park, Colorado, presented at 28th Annual NREL Silicon Workshop, Winter Park, Colorado, 12 August 2018 - 15 August 2018


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