Scheduled Maintenance Notice
Please note that Researcher Profiles will be undergoing scheduled maintenance on Wednesday 7th Oct, from 8:00am to 9:00am. During this time, the Researcher Profiles system will be unavailable. We apologise for any inconvenience and appreciate your understanding.
Select Publications
Conference Papers
, 2000, 'Growth and characterisation of GaN grown by microwave plasma assisted laser-induced chemical vapour deposition', in Conference on Optoelectronic and Microelectronic Materials and Devices Proceedings COMMAD, pp. 129 - 132, http://dx.doi.org/10.1109/COMMAD.2000.1022908
, 2000, 'Optical spectroscopy of GaSb/GaAs self-assembled quantum dots grown by MOCVD', in Conference on Optoelectronic and Microelectronic Materials and Devices Proceedings COMMAD, pp. 419 - 422, http://dx.doi.org/10.1109/COMMAD.2000.1022979
, 1996, 'Application of ArF excimer laser in MOCVD growth and in situ characterisation of gallium nitride', in IEEE/LEOS 1996 SUMMER TOPICAL MEETINGS - ADVANCED APPLICATIONS OF LASERS IN MATERIALS AND PROCESSING, DIGEST, I E E E, CO, KEYSTONE, pp. 45 - 46, presented at IEEE/LEOS 1996 Summer Topical Meeting - Advanced Applications of Lasers in Materials Processing, CO, KEYSTONE, 05 August 1996 - 09 August 1996
, 1996, 'X-ray photoelectron spectroscopy depth profiling of aluminium nitride thin films', in SURFACE AND INTERFACE ANALYSIS, JOHN WILEY & SONS LTD, MI, ANN ARBOR, pp. 99 - 104, presented at Surface Analysis 96, MI, ANN ARBOR, 12 June 1996 - 14 June 1996, http://dx.doi.org/10.1002/(SICI)1096-9918(199702)25:2<99::AID-SIA212>3.3.CO;2-L
, 1993, 'IMPLICATIONS OF CARRIER MOBILITY LIMITATIONS FOR GAAS AS AN X-RAY-DETECTOR', in Siegmund OHW (ed.), EUV, X-RAY, AND GAMMA-RAY INSTRUMENTATION FOR ASTRONOMY IV, SPIE - INT SOC OPTICAL ENGINEERING, CA, SAN DIEGO, pp. 40 - 50, presented at Conference on EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IV, CA, SAN DIEGO, 11 July 1993 - 12 July 1993, http://dx.doi.org/10.1117/12.162849