Select Publications

Journal articles

Grant NE; Markevich VP; Mullins J; Peaker AR; Rougieux F; Macdonald D; Murphy JD, 2016, 'Permanent annihilation of thermally activated defects which limit the lifetime of float-zone silicon', Physica Status Solidi A Applications and Materials Science, 213, pp. 2844 - 2849, http://dx.doi.org/10.1002/pssa.201600360

Sun C; Rougieux FE; Degoulange J; Einhaus R; Macdonald D, 2016, 'Reassessment of the recombination properties of aluminium–oxygen complexes in n- and p-type Czochralski-grown silicon', Physica Status Solidi B Basic Research, 253, pp. 2079 - 2084, http://dx.doi.org/10.1002/pssb.201600363

Grant NE; Markevich VP; Mullins J; Peaker AR; Rougieux F; Macdonald D, 2016, 'Thermal activation and deactivation of grown-in defects limiting the lifetime of float-zone silicon', Physica Status Solidi Rapid Research Letters, 10, pp. 443 - 447, http://dx.doi.org/10.1002/pssr.201600080

Rougieux F; Samundsett C; Fong KC; Fell A; Zheng P; MacDonald D; Degoulange J; Einhaus R; Forster M, 2016, 'High efficiency UMG silicon solar cells: Impact of compensation on cell parameters', Progress in Photovoltaics Research and Applications, 24, pp. 725 - 734, http://dx.doi.org/10.1002/pip.2729

Zheng P; Rougieux FE; Samundsett C; Yang X; Wan Y; Degoulange J; Einhaus R; Rivat P; Macdonald D, 2016, 'Upgraded metallurgical-grade silicon solar cells with efficiency above 20%', Applied Physics Letters, 108, http://dx.doi.org/10.1063/1.4944788

Nguyen HT; Rougieux FE; Yan D; Wan Y; Mokkapati S; De Nicolas SM; Seif JP; De Wolf S; MacDonald D, 2016, 'Characterizing amorphous silicon, silicon nitride, and diffused layers in crystalline siliconsolarcellsusingmicro-photoluminescence spectroscopy', Solar Energy Materials and Solar Cells, 145, pp. 403 - 411, http://dx.doi.org/10.1016/j.solmat.2015.11.006

Sun C; Liu AY; Phang SP; Rougieux FE; MacDonald D, 2015, 'Charge states of the reactants in the hydrogen passivation of interstitial iron in P-type crystalline silicon', Journal of Applied Physics, 118, http://dx.doi.org/10.1063/1.4929757

Nguyen HT; Rougieux FE; Wang F; Tan H; Macdonald D, 2015, 'Micrometer-Scale Deep-Level Spectral Photoluminescence from Dislocations in Multicrystalline Silicon', IEEE Journal of Photovoltaics, 5, pp. 799 - 804, http://dx.doi.org/10.1109/JPHOTOV.2015.2407158

Rougieux FE; Grant NE; Barugkin C; MacDonald D; Murphy JD, 2015, 'Influence of annealing and bulk hydrogenation on lifetime-limiting defects in nitrogen-doped floating zone silicon', IEEE Journal of Photovoltaics, 5, pp. 495 - 498, http://dx.doi.org/10.1109/JPHOTOV.2014.2367912

Grant NE; Rougieux FE; MacDonald D; Bullock J; Wan Y, 2015, 'Grown-in defects limiting the bulk lifetime of p -type float-zone silicon wafers', Journal of Applied Physics, 117, http://dx.doi.org/10.1063/1.4907804

Sun C; Rougieux FE; Macdonald D, 2015, 'A unified approach to modelling the charge state of monatomic hydrogen and other defects in crystalline silicon', Journal of Applied Physics, 117, http://dx.doi.org/10.1063/1.4906465

Zheng P; Rougieux FE; Grant NE; Macdonald D, 2015, 'Evidence for vacancy-related recombination active defects in as-grown N-type czochralski silicon', IEEE Journal of Photovoltaics, 5, pp. 183 - 188, http://dx.doi.org/10.1109/JPHOTOV.2014.2366687

Nguyen HT; Rougieux FE; Baker-Finch SC; MacDonald D, 2015, 'Impact of carrier profile and rear-side reflection on photoluminescence spectra in planar crystalline silicon wafers at different temperatures', IEEE Journal of Photovoltaics, 5, pp. 77 - 81, http://dx.doi.org/10.1109/JPHOTOV.2014.2359737

Sun C; Rougieux FE; Macdonald D, 2014, 'Reassessment of the recombination parameters of chromium in n- and p-type crystalline silicon and chromium-boron pairs in p-type crystalline silicon', Journal of Applied Physics, 115, http://dx.doi.org/10.1063/1.4881497

Rougieux FE; MacDonald D, 2014, 'Reading data stored in the state of metastable defects in silicon using band-band photoluminescence: Proof of concept and physical limits to the data storage density', Applied Physics Letters, 104, http://dx.doi.org/10.1063/1.4870002

Zheng P; Rougieux FE; MacDonald D; Cuevas A, 2014, 'Measurement and parameterization of carrier mobility sum in silicon as a function of doping, temperature and injection level', IEEE Journal of Photovoltaics, 4, pp. 560 - 565, http://dx.doi.org/10.1109/JPHOTOV.2013.2294755

Hameiri Z; Rougieux F; Sinton R; Trupke T, 2014, 'Contactless determination of the carrier mobility sum in silicon wafers using combined photoluminescence and photoconductance measurements', Applied Physics Letters, 104, pp. 073506, http://dx.doi.org/10.1063/1.4865804

Nguyen HT; Rougieux FE; Mitchell B; Macdonald D, 2014, 'Temperature dependence of the band-band absorption coefficient in crystalline silicon from photoluminescence', Journal of Applied Physics, 115, pp. 043710, http://dx.doi.org/10.1063/1.4862912

Forster M; Wagner P; Degoulange J; Einhaus R; Galbiati G; Rougieux FE; Cuevas A; Fourmond E, 2014, 'Impact of compensation on the boron and oxygen-related degradation of upgraded metallurgical-grade silicon solar cells', Solar Energy Materials and Solar Cells, 120, pp. 390 - 395, http://dx.doi.org/10.1016/j.solmat.2013.06.014

Rougieux FE; Grant NE; Macdonald D, 2013, 'Thermal deactivation of lifetime- limiting grown-in point defects in n-type Czochralski silicon wafers', Physica Status Solidi Rapid Research Letters, 7, pp. 616 - 618, http://dx.doi.org/10.1002/pssr.201308053

Lim SY; Rougieux FE; Macdonald D, 2013, 'Boron-oxygen defect imaging in p-type Czochralski silicon', Applied Physics Letters, 103, http://dx.doi.org/10.1063/1.4819096

Forster M; Rougieux FE; Cuevas A; Dehestru B; Thomas A; Fourmond E; Lemiti M, 2013, 'Incomplete Ionization and Carrier Mobility in Compensated $p$-Type and $n$-Type Silicon', 2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2, pp. 1 - 6

Forster M; Rougieux FE; Cuevas A; Dehestru B; Thomas A; Fourmond E; Lemiti M, 2013, 'Incomplete ionization and carrier mobility in compensated p-type and n-type silicon', IEEE Journal of Photovoltaics, 3, pp. 108 - 113, http://dx.doi.org/10.1109/JPHOTOV.2012.2210032

MacDonald D; Phang SP; Rougieux FE; Lim SY; Paterson D; Howard DL; De Jonge MD; Ryan CG, 2012, 'Iron-rich particles in heavily contaminated multicrystalline silicon wafers and their response to phosphorus gettering', Semiconductor Science and Technology, 27, http://dx.doi.org/10.1088/0268-1242/27/12/125016

Forster M; Cuevas A; Fourmond E; Rougieux FE; Lemiti M, 2012, 'Impact of incomplete ionization of dopants on the electrical properties of compensated p-type silicon', Journal of Applied Physics, 111, http://dx.doi.org/10.1063/1.3686151

Forster M; Fourmond E; Rougieux FE; Cuevas A; Gotoh R; Fujiwara K; Uda S; Lemiti M, 2012, 'Boron-oxygen defect in Czochralski-silicon co-doped with gallium and boron', Applied Physics Letters, 100, http://dx.doi.org/10.1063/1.3680205

Rougieux FE; Zheng P; Thiboust M; Tan J; Grant NE; MacDonald DH; Cuevas A, 2012, 'A contactless method for determining the carrier mobility sum in silicon wafers', IEEE Journal of Photovoltaics, 2, pp. 41 - 46, http://dx.doi.org/10.1109/JPHOTOV.2011.2175705

Rougieux FE; Forster M; MacDonald D; Cuevas A; Lim B; Schmidt J, 2011, 'Recombination activity and impact of the boron-oxygen-related defect in compensated N-type silicon', IEEE Journal of Photovoltaics, 1, pp. 54 - 58, http://dx.doi.org/10.1109/JPHOTOV.2011.2165698

Rougieux FE; Lim B; Schmidt J; Forster M; MacDonald D; Cuevas A, 2011, 'Influence of net doping, excess carrier density and annealing on the boron oxygen related defect density in compensated n-type silicon', Journal of Applied Physics, 110, http://dx.doi.org/10.1063/1.3633492

Tan J; MacDonald D; Rougieux F; Cuevas A, 2011, 'Accurate measurement of the formation rate of iron-boron pairs in silicon', Semiconductor Science and Technology, 26, http://dx.doi.org/10.1088/0268-1242/26/5/055019

MacDonald D; Rougieux F; Mansoulie Y; Tan J; Paterson D; Howard DL; De Jonge MD; Ryan CG, 2010, 'Scanning X-ray fluorescence microspectroscopy of metallic impurities in solar-grade silicon', Physica Status Solidi A Applications and Materials Science, 207, pp. 1807 - 1810, http://dx.doi.org/10.1002/pssa.201026137

Rougieux FE; MacDonald D; Cuevas A; Ruffell S; Schmidt J; Lim B; Knights AP, 2010, 'Electron and hole mobility reduction and Hall factor in phosphorus-compensated p -type silicon', Journal of Applied Physics, 108, http://dx.doi.org/10.1063/1.3456076

Rougieux FE; MacDonald D; McIntosh KR; Cuevas A, 2010, 'Characteristics of an oxidation-induced inversion layer in compensated p-type crystalline silicon', Semiconductor Science and Technology, 25, http://dx.doi.org/10.1088/0268-1242/25/5/055009

MacDonald D; Rougieux F; Cuevas A; Lim B; Schmidt J; Di Sabatino M; Geerligs LJ, 2009, 'Light-induced boron-oxygen defect generation in compensated p -type Czochralski silicon', Journal of Applied Physics, 105, http://dx.doi.org/10.1063/1.3121208

Conference Papers

Wang Z; McNab S; Cai Y; Cheng Y; Rougieux F; Song N, 2024, 'Balancing Pinhole Density and Doping Depth in for High Quality P+ TOPCon Layers', in Proceedings of the Asia Pacific Solar Research Conference 2024, Australian PV Institute, Sydney, Australia, presented at Asia Pacific Solar Research Conference 2024’, Sydney, Australia, 03 December 2024 - 05 December 2024, http://dx.doi.org/10.26190/unsworks/30838

Zou Y; Zhou Z; Sun C; Jin Q; Wang Y; Rougieux F; Song N, 2024, 'The Impact of Oxygen Concentration on LID in Gallium Doped Wafers', in Sun C; Rougieux F (ed.), Proceedings of the Asia Pacific Solar Research Conference 2024, Australian PV Institute, Sydney, presented at Asia Pacific Solar Research Conference 2024, Sydney, 03 December 2024 - 05 December 2024, http://dx.doi.org/10.26190/unsworks/30837

Xia D; Sharma ASS; Pusch A; Tayebjee MJY; Nielsen MP; Rougieux FE; Dorman KR; Mishima TD; Santos MB; Sellers IR; Ekins-Daukes NJ; Krich JJ, 2024, 'Global analysis of valley photovoltaic devices demonstrates challenges of current designs', in 2024 IEEE 52ND PHOTOVOLTAIC SPECIALIST CONFERENCE, PVSC, IEEE, WA, Seattle, pp. 0494 - 0494, presented at 52nd Photovoltaic Specialist Conference, WA, Seattle, 15 November 2024, http://dx.doi.org/10.1109/PVSC57443.2024.10749061

Sabah SH; Le TT; Zhou Z; Sun C; Wang Y; Jin Q; Rougieux FE; Macdonald D; Liu A, 2024, 'Recombination Activity of Chromium-Gallium Pairs in Silicon', Institute of Electrical and Electronics Engineers (IEEE), pp. 504 - 504, presented at 2024 IEEE 52nd Photovoltaic Specialist Conference (PVSC), http://dx.doi.org/10.1109/pvsc57443.2024.10748828

Thite SD; Danish N; Florez GO; Rougieux F, 2024, 'A Three-Step Approach to Shift from Assessment Integrity to Assurance of Learning in the Age of AI', in 2024 World Engineering Education Forum Global Engineering Deans Council Weef Gedc 2024, http://dx.doi.org/10.1109/WEEF-GEDC63419.2024.10854944

Deng S; Gentle A; Roemer U; Cai Y; Cheng Y; Rougieux F; Green M; Song N, 2023, 'Influence of light element incorporation on poly-Si/SiOX passivated contact', in Proceedings of the Asia Pacific Solar Research Conference 2023, Australian PV Institute, Melbourne,Australian, presented at Asia Pacific Solar Research Conference 2023, Melbourne,Australian, 03 December 2023 - 05 December 2023, http://dx.doi.org/10.26190/unsworks/30834

Rougieux FE; Hossain MA; Hoex B, 2023, 'Density functional theory to calculate accurate defect energy levels in silicon', in Aip Conference Proceedings, http://dx.doi.org/10.1063/5.0141286

Zhou Z; Juhl MK; Vaqueiro-Contreras M; Rougieux F; Coletti G, 2022, 'Deep Level Transient Spectroscopy Study of Float-zone Silicon Degradation under Light and Elevated Temperature', in Aip Conference Proceedings, http://dx.doi.org/10.1063/5.0089221

Song N; Ng C; Roemer U; Deng S; Cai Y; Rougieux F, 2021, 'Tuning the crystalline and optical properties of sputtered polysilicon carbide contacts', Sydney, Australia, presented at 31st International Photovoltaic Science and Engineering Conference, Sydney, Sydney, Australia, 13 December 2021 - 15 December 2021

Zhou Z; Vaqueiro-Contreras M; Juhl MK; Rougieux F, 2021, 'Electronic Properties of the Boron-oxygen Defect Precursor in Silicon', in Conference Record of the IEEE Photovoltaic Specialists Conference, pp. 269 - 271, http://dx.doi.org/10.1109/PVSC43889.2021.9519027

Jafari S; Zhu Y; Rougieux F; De Guzman JA; Markevich V; Peaker A; Hameiri Z, 2020, 'Boron-oxygen-related traps in Czochralski grown silicon', Online, presented at Asia Pacific Solar Research Conference, Online, 30 November 2020

Jafari S; Zhu Y; Rougieux F; De Guzman JAT; Markevich VP; Peaker AR; Hameiri Z, 2020, 'Boron-oxygen related light-induced degradation of Si solar cells: Transformation between minority carrier trapping and recombination active centers', in Conference Record of the IEEE Photovoltaic Specialists Conference, Institute of Electrical and Electronics Engineers (IEEE), Virtual, pp. 0689 - 0692, presented at 47th IEEE Photovoltaics Specialists Conference, Virtual, 15 June 2020 - 21 August 2020, http://dx.doi.org/10.1109/PVSC45281.2020.9300371

Siriwardhana M; Rougieux FE; MacDonald D, 2020, 'Defect luminescence from thermal donors in silicon: Impact of dopant type and thermal donor concentration', in Conference Record of the IEEE Photovoltaic Specialists Conference, pp. 2652 - 2654, http://dx.doi.org/10.1109/PVSC45281.2020.9300685

Rougieux F; Sun C; Juhl M, 2020, 'The Boron-Oxygen Defect: Does its Concentration Really Depends on the Boron/Dopant Concentration?', in Conference Record of the IEEE Photovoltaic Specialists Conference, pp. 2522 - 2524, http://dx.doi.org/10.1109/PVSC45281.2020.9300431

Jafari S; Zhu Y; Rougieux F; Hameiri Z, 2019, 'Trapping in multi-crystalline silicon wafers: Impact of laser treatment and firing', Canberra, presented at Asia-Pacific Solar Research Conference, Canberra, 03 December 2019

Jafari S; Zhu Y; Rougieux F; Hameiri Z, 2019, 'Trapping in multi-crystalline silicon wafers: Impact of laser treatment and firing', Marseille, France, presented at European Photovoltaic Solar Energy Conference and Exhibition, Marseille, France, 09 September 2019 - 13 September 2019


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