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By Associate Professor William McLean

Patents

Kampwerth H; Wang KW; MCLEAN , 2015, A method and apparatus for testing the performance of a semiconductor material, Patent No. , Patent Agent:Griffithhack


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ORCID as entered in ROS

orcid_icon https://orcid.org/0000-0002-7133-2884

UNSW Sydney NSW 2052 Australia Telephone +61 2 93851000
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