By Dr Catherine Emily Chan

Conference Posters

Varshney U; Liu S; Chen D; Kim M; Abbott M; Payne D; Hoex B; Chan C; Wenham S; Sen C, 2018, 'Influence of dielectric passivation layer thickness on LeTID in multicrystalline silicon', Hawaii, USA, Vol. 00, pp. 363 - 367, presented at WCPEC-7, Hawaii, USA, 10 June 2018 - 15 June 2018, http://dx.doi.org/10.1109/PVSC.2018.8547618

chan C; payne D; abbott M; Chen D; ciesla A; chen R; hallam B; wenham S, 2017, 'Investigations of carrier-induced degradation behaviour in p-type mc-Si', Washington DC, presented at 44th IEEE Photovoltaics Specialist Conference, Washington DC, 25 June 2017 - 30 June 2017, http://dx.doi.org/10.26190/unsworks/26576

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