By Dr Shaoyang Liu

Journal articles

Poddar S; Liu S; Hamer P; Kay M; Hoex B, 2026, 'Closing the UV-Induced Photodegradation Gap Through Global Scale Modeling of Fixed Tilt and Tracking Photovoltaic Systems', IEEE Journal of Photovoltaics, 16, pp. 494 - 503, http://dx.doi.org/10.1109/JPHOTOV.2026.3668778

Wang Z; Cheng G; Liu H; Wang Z; Wu K; Chen D; Chen Y; Liu S; Gao J; Ding J, 2025, 'Study on excellent contact performance of double-sided copper-plated metallization', Journal of Materials Science: Materials in Electronics, 36, pp. 272, http://dx.doi.org/10.1007/s10854-025-14340-x

Chen D; Kim M; Shi J; Vicari Stefani B; Yu Z; Liu S; Einhaus R; Wenham S; Holman Z; Hallam B, 2021, 'Defect engineering of p-type silicon heterojunction solar cells fabricated using commercial-grade low-lifetime silicon wafers', Progress in Photovoltaics Research and Applications, 29, pp. 1165 - 1179, http://dx.doi.org/10.1002/pip.3230

Varshney U; Chan C; Hoex B; Hallam B; Hamer P; Ciesla A; Chen D; Liu S; Sen C; Samadi A; Abbott M, 2020, 'Controlling Light- And Elevated-Temperature-Induced Degradation with Thin Film Barrier Layers', IEEE Journal of Photovoltaics, 10, pp. 19 - 27, http://dx.doi.org/10.1109/JPHOTOV.2019.2945199

Sen C; Chan C; Hamer P; Wright M; Varshney U; Liu S; Chen D; Samadi A; Ciesla A; Chong CM; Hallam B; Abbott M, 2019, 'Annealing prior to contact firing: A potential new approach to suppress LeTID', Solar Energy Materials and Solar Cells, 200, http://dx.doi.org/10.1016/j.solmat.2019.109938

Varshney U; Abbott M; Ciesla A; Chen D; Liu S; Sen C; Kim M; Wenham S; Hoex B; Chan C, 2019, 'Evaluating the Impact of SiNx Thickness on Lifetime Degradation in Silicon', IEEE Journal of Photovoltaics, 9, pp. 601 - 607, http://dx.doi.org/10.1109/JPHOTOV.2019.2896671

Sen C; Kim M; Chen D; Varshney U; Liu S; Samadi A; Ciesla A; Wenham SR; Chan CE; Chong C; Abbott MD; Hallam BJ, 2019, 'Assessing the Impact of Thermal Profiles on the Elimination of Light- and Elevated-Temperature-Induced Degradation', IEEE Journal of Photovoltaics, 9, pp. 40 - 48, http://dx.doi.org/10.1109/JPHOTOV.2018.2874769

Liu S; Payne D; Vargas Castrillon C; Chen D; Kim M; Sen C; Varshney U; Hameiri Z; Chan C; Abbott M; Wenham S, 2018, 'Impact of dark annealing on the kinetics of light- and elevated-temperature-induced degradation', IEEE Journal of Photovoltaics, 8, pp. 1494 - 1494, http://dx.doi.org/10.1109/JPHOTOV.2018.2866325

Chen D; Hamer P; Kim M; bourett-sicotte G; liu S; chan C; ciesla A; chen R; abbott M; hallam B; wenham S, 2018, 'Hydrogen induced degradation: A possible mechanism for light- and elevated temperature- induced degradation in n-type silicon', Solar Energy Materials and Solar Cells, 185, pp. 174 - 182, http://dx.doi.org/10.1016/j.solmat.2018.05.034

Hallam BJ; Ciesla AM; Chan CC; Soeriyadi A; Liu S; Soufiani AM; Wright M; Wenham S, 2018, 'Overcoming the Challenges of Hydrogenation in Silicon Solar Cells', Australian Journal of Chemistry, 71, pp. 743 - 752, http://dx.doi.org/10.1071/CH18271

Conference Papers

Samadi A; Sen C; Liu S; Varshney U; Chen D; Kim M; Soufiani AM; Contreras MV; Chong CM; Ciesla A; Abbott M; Chan C, 2019, 'Hydrogenation of dislocations in p-type cast-mono silicon', in Aip Conference Proceedings, http://dx.doi.org/10.1063/1.5123894

Chen D; Hamer P; Kim M; Mullins J; Sen C; Khan M; Oshima T; Abe H; Liu S; Ciesla A; Chan C; Chen R; Rougieux F; Zhou Z; Wright B; Varshney U; Vicari Stefani B; Soeriyadi A; Vargas Castrillon C; Samadi A; Hameiri Z; zhang X; Jin H; Qi W; Abbott M; Chong C; Peaker A; Hallam B, 2019, 'Will LeTID remain a commercial problem? Evaluating the solutions and a possible root cause. (LeTID仍是一个商业难题吗？根源分析和问题解决)', Wuxi, China, presented at 18th Issue PV WE CLASS-Crystalline Silicon Advanced Technology and Materials Forum, Wuxi, China, 24 April 2019 - 24 May 2019, http://dx.doi.org/10.26190/unsworks/27317

Chen D; Kim M; Shi J; Yu ZJ; Leilaeioun AM; Liu S; Stefani B; Wenham S; Einhaus R; Holman Z; Hallam B, 2018, '< 700 mV Open-Circuit Voltages on Defect-Engineered P-type Silicon Heterojunction Solar Cells on Czochralski and Multicrystalline Wafers', in 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion Wcpec 2018 A Joint Conference of 45th IEEE Pvsc 28th Pvsec and 34th Eu Pvsec, pp. 1677 - 1681, http://dx.doi.org/10.1109/PVSC.2018.8548239

Liu S; Chan C; Chen D; Kim M; Sen C; Varshney U; Hallam B; Abbott M; Wenham S; Payne D, 2018, 'Investigation of temperature and illumination dependencies of carrier-induced degradation in p -type multi-crystalline silicon', in Aip Conference Proceedings, http://dx.doi.org/10.1063/1.5049333

Wenham ACN; Wenham S; Chen R; Chan C; Chen D; Hallam B; Payne D; Fung T; Kim M; Liu S; Wang S; Kim K; Samadi A; Sen C; Vargas C; Varshney U; Stefani BV; Hamer P; Bourret-Sicotte G; Nampalli N; Hameiri Z; Chong C; Abbott M, 2018, 'Hydrogen-induced degradation', Hawaii, USA, pp. 1 - 8, presented at 7th World Conference on Photovoltaic Energy Conversion, Hawaii, USA, 10 June 2018 - 17 June 2018, http://dx.doi.org/10.1109/PVSC.2018.8548100

chan C; abbott M; Chen D; chen R; chong C; ciesla A; hallam B; hameiri Z; kim K; liu S; samadi A; varshney U; wenham S, 2017, 'New insights into degradation in multi-crystalline silicon PERC Cells', Shanghai, China, presented at 2017 World Solar Congress, Shanghai, China, 04 September 2017 - 06 September 2017

Conference Posters

Varshney U; Liu S; Chen D; Kim M; Abbott M; Payne D; Hoex B; Chan C; Wenham S; Sen C, 2018, 'Influence of dielectric passivation layer thickness on LeTID in multicrystalline silicon', Hawaii, USA, Vol. 00, pp. 363 - 367, presented at WCPEC-7, Hawaii, USA, 10 June 2018 - 15 June 2018, http://dx.doi.org/10.1109/PVSC.2018.8547618

Conference Presentations

Chen DE; Shi J; Kim M; Yu Z; Leilaeioun M; Vicari Stefani B; Einhaus R; Wenham S; Holman Z; Hallam BJ, 2018, '>700 mV Open-circuit Voltages on Defect-Engineered P-type Silicon Heterojunction Solar Cells on Czochralski and Multicrystalline Wafers', presented at 7th World Conference on Photovoltaic Energy Conversion (WCPEC), Waikaloa, Hawaii, USA, 10 June 2018 - 15 June 2018

Chen D; Hamer P; Kim M; Bourett-Sicotte G; Liu S; Ciesla A; Chan C; Chen R; Fung TH; Vargas C; Ye Q; Abbott M; Hallam BJ; Wenham SR, 2018, 'Hydrogen Induced Degradation : A Possible Mechanism for Light and Elevated Temperature Induced Degradation (LeTID) in n-type Silicon', presented at 8th International Conference on Crystalline Silicon Photovoltaics, Lausanne Switzerland, 19 March 2018 - 18 May 2018, http://dx.doi.org/10.1016/j.solmat.2018.05.034

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