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By Dr Tuomo Ilmari Tanttu

Preprints

Saira O-P; Yoon Y; Tanttu T; Möttönen M; Averin DV; Pekola JP, 2012, Test of Jarzynski and Crooks fluctuation relations in an electronic system, http://dx.doi.org/10.48550/arxiv.1206.7049

Rahman MM; Vahapoglu E; Chan KW; Tanttu T; Dash A; Huang JY; Yianni S; Chenniappan V; Cifuentes JD; Hudson F; Escott CC; Lee YK; Stuyck ND; Laucht A; Morello A; Saraiva A; Cole JH; Dzurak AS; Lim WH, Gate Stack Engineering for High-Mobility and Low-Noise SiMOS Quantum Devices, http://dx.doi.org/10.21203/rs.3.rs-9297493/v1


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