By Dr Muhammad Umair Khan

Preprints

Yang J; Khan MU; Wu X; Sen C; Jiang Y; Hoex B; Rougieux F, 2026, Energy-Dependent Increase in Dit and Larger Capture Cross Sections Drive UV-Induced Degradation ​, http://dx.doi.org/10.2139/ssrn.6511845

Khan MU; Ciesla A; Johns A; Sen C; Huang T; Song H; Gao M; Lv R; Yu Y; Wu X; Wang H; Wang X; Hoex B, 2025, Charge Trapping, Hydrogen Accumulation, and Structural Rearrangement: A Complete Model for Ultraviolet-Induced Degradation in TOPCon Devices, http://dx.doi.org/10.2139/ssrn.5609797

Wang H; Sen C; Fu J; Khan MU; Wu Y; Song H; Lv R; Conibeer G; Hoex B, 2024, How Solder Flux Can Cause Significant Degradation in Heterojunction Cells, http://dx.doi.org/10.22541/au.172115394.42991480/v1

Sen C; Wang H; Wu X; Khan MU; Chan C; Abbott M; Hoex B, Four Failure Modes in Silicon Heterojunction Glass-Backsheet Modules, http://dx.doi.org/10.2139/ssrn.4293027

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