By Dr Muhammad Umair Khan

Preprints

Wang H; Sen C; Fu J; Khan MU; Wu Y; Song H; Lv R; Conibeer G; Hoex B, 2024, How Solder Flux Can Cause Significant Degradation in Heterojunction Cells, http://dx.doi.org/10.22541/au.172115394.42991480/v1

Sen C; Wang H; Wu X; Khan MU; Chan C; Abbott M; Hoex B, Four Failure Modes in Silicon Heterojunction Glass-Backsheet Modules, http://dx.doi.org/10.2139/ssrn.4293027

Back to profile page