By Associate Professor Omar Khadeer Hussain

Journal articles

Hussain OK; Chang E; Hussain F; Dillon T, 2006, 'A methodology for risk measurement in e-transactions', A methodology for risk measurement in e-transactions

Hussain OM; Swapnasmitha AS; John J; Pinto R, 2005, 'Structure and morphology of laser-ablated WO3 thin films', APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 81, pp. 1291 - 1297, http://dx.doi.org/10.1007/s00339-004-3041-z

Ramana CV; Hussain OM; Naidu BS; Reddy PJ, 1997, 'Influence of substrate temperature on the composition and structural properties of electron beam evaporated V2O5 thin films', Vacuum, 48, pp. 431 - 434, http://dx.doi.org/10.1016/s0042-207x(96)00304-1

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