ORCID as entered in ROS
![orcid_icon](/themes/resgate8/images/icons/ORCIDiD_icon24x24.png)
Select Publications
2017, 'Investigations of carrier-induced degradation behaviour in p-type mc-Si', Washington DC, presented at 44th IEEE Photovoltaics Specialist Conference, Washington DC, 25 June 2017 - 30 June 2017, http://dx.doi.org/10.26190/unsworks/26576
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