By Dr Wayne Hutchison

Preprints

Hutchison WD; Alexander LK; Suwuntanasarn N; Milford GN, 2010, Pulsed ESR Measurement of Coherence Times in Si:P at Very Low Temperatures, , http://dx.doi.org/10.48550/arxiv.1002.4069

Spizzirri PG; Hutchison WD; Stavrias N; McCallum JC; Suwuntanasarn N; Alexander LK; Prawer S, 2010, ESR studies of ion implanted phosphorus donors near the Si-SiO2 interface, , http://dx.doi.org/10.48550/arxiv.1002.1764

McCamey DR; Huebl H; Brandt MS; Hutchison WD; McCallum JC; Clark RG; Hamilton AR, 2006, Electrically-detected magnetic resonance in ion-implanted Si:P nanostructures, , http://dx.doi.org/10.48550/arxiv.cond-mat/0605516

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