ORCID as entered in ROS

Select Publications
Seidel J, 2019, 'Scaling and channelling behavior of helical and skyrmion spin textures in thin films of Te-doped Cu2OSeO3', Cambridge University Press, presented at Cambridge University Press, Cambridge University Press, 05 August 2019, http://dx.doi.org/10.1017/S1431927619000886
Sun H; Huang J; Yun JS; Sun K; Yan C; Liu F; Park J; Pu A; Seidel J; Stride JA; Green M; Hao X, 2019, 'Solution-processed ultrathin SnO
Seidel J, 2017, 'Flame based growth of ZnO nano- and microstructures for advanced optical, multifunctional devices, and biomedical applications', in Flame based growth of ZnO nano- and microstructures for advanced optical, multifunctional devices, and biomedical applications, SPIE Microtechnologies, Barcelona, presented at SPIE Microtechnologies, Barcelona, - , http://dx.doi.org/10.1117/12.2265704
Seidel J, 2015, 'Electric-field control of magnetism in multiferroic heterostructures', in 2015 IEEE International Magnetics Conference, INTERMAG 2015, Beijing, presented at INTERMAG 2105, Beijing, 11 May 2015 - 15 May 2015, http://dx.doi.org/10.1109/INTMAG.2015.7156525
Winnerl S; Stehr D; Drachenko O; Schneider H; Helm M; Seidel W; Michel P; Schneider S; Seidel J; Grafström S; Eng LM; Roch T; Strasser G; Maier T; Walther M, 2006, 'FELBE free-electron laser: Status and application for time resolved spectroscopy experiments', in IRMMW-THz 2006 - 31st International Conference on Infrared and Millimeter Waves and 14th International Conference on Terahertz Electronics, pp. 159, http://dx.doi.org/10.1109/ICIMW.2006.368367
Eng LM; Grafström S; Hellmann I; Loppacher C; Otto T; Renger J; Schlaphof F; Seidel J; Zerweck U, 2004, 'Nanoscale non-destructive electric field probing in ferroelectrics, organic molecular films, and near-field optical nanodevices', in Proceedings of SPIE - The International Society for Optical Engineering, pp. 21 - 35, http://dx.doi.org/10.1117/12.544503
Otto T; Grafström S; Seidel J; Eng LM, 2002, 'Novel transparent electrodes for electro-optical near-field microscopy', in Proceedings of SPIE - The International Society for Optical Engineering, pp. 366 - 370, http://dx.doi.org/10.1117/12.515797