Select Publications
Conference Papers
2020, 'Investigation of electromechanical and ferroelectric properties of abalone shell using scanning probe microscopy techniques', Melbourne, presented at International Conference on Nanostructured Materials (NANO 2020), Melbourne, 06 July 2020 - 10 July 2020, https://search.informit.org/doi/10.3316/INFORMIT.199577773773032
,2019, 'Scaling and channelling behavior of helical and skyrmion spin textures in thin films of Te-doped Cu2OSeO3', Cambridge University Press, presented at Cambridge University Press, Cambridge University Press, 05 August 2019, http://dx.doi.org/10.1017/S1431927619000886
,2019, 'Solution-processed ultrathin SnO
2017, 'Flame based growth of ZnO nano- and microstructures for advanced optical, multifunctional devices, and biomedical applications', in Tiginyanu IM (ed.), Proceedings of SPIE--the International Society for Optical Engineering, SPIE, the international society for optics and photonics, Barcelona, pp. 102480d-102480d-1, presented at SPIE Microtechnologies, Barcelona, - , http://dx.doi.org/10.1117/12.2265704
,2015, 'Electric-field control of magnetism in multiferroic heterostructures', in 2015 IEEE International Magnetics Conference, INTERMAG 2015, Institute of Electrical and Electronics Engineers (IEEE), Beijing, pp. 1 - 1, presented at INTERMAG 2105, Beijing, 11 May 2015 - 15 May 2015, http://dx.doi.org/10.1109/INTMAG.2015.7156525
,2006, 'FELBE free-electron laser: Status and application for time resolved spectroscopy experiments', in IRMMW-THz 2006 - 31st International Conference on Infrared and Millimeter Waves and 14th International Conference on Terahertz Electronics, pp. 159, http://dx.doi.org/10.1109/ICIMW.2006.368367
,2004, 'Nanoscale non-destructive electric field probing in ferroelectrics, organic molecular films, and near-field optical nanodevices', in Proceedings of SPIE - The International Society for Optical Engineering, pp. 21 - 35, http://dx.doi.org/10.1117/12.544503
,2002, 'Novel transparent electrodes for electro-optical near-field microscopy', in Proceedings of SPIE - The International Society for Optical Engineering, pp. 366 - 370, http://dx.doi.org/10.1117/12.515797
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