Select Publications
Journal articles
2023, 'Surface analysis insight note: Differentiation methods applicable to noisy data for determination of sp2- versus sp3-hybridization of carbon allotropes and AES signal strengths', Surface and Interface Analysis, 55, pp. 165 - 175, http://dx.doi.org/10.1002/sia.7157
,2022, 'Conversion of glucose to fructose over Sn and Ga-doped zeolite Y in methanol and water media', Applied Catalysis A: General, 642, http://dx.doi.org/10.1016/j.apcata.2022.118689
,2022, 'Argon cluster-ion sputter yield: Molecular dynamics simulations on silicon and equation for estimating total sputter yield', Surface and Interface Analysis, 54, pp. 341 - 348, http://dx.doi.org/10.1002/sia.6996
,2022, 'Definition of a new (Doniach-Sunjic-Shirley) peak shape for fitting asymmetric signals applied to reduced graphene oxide/graphene oxide XPS spectra', Surface and Interface Analysis, 54, pp. 67 - 77, http://dx.doi.org/10.1002/sia.7021
,2021, 'A comparison of the molecular composition of plant and fungal structural biopolymer standards with the organic material in early cretaceous Ontong Java Plateau Tuff', Chemical Geology, 565, http://dx.doi.org/10.1016/j.chemgeo.2021.120078
,2020, 'Copper-Indium Binary Catalyst on a Gas Diffusion Electrode for High-Performance CO
2020, 'Computer-readable Image Markers for Automated Registration in Correlative Microscopy', arXiv preprint arXiv:2011.14949, https://arxiv.org/abs/2011.14949
,2019, 'Antimicrobial properties of Cu-based bulk metallic glass composites after surface modification', Surface and Coatings Technology, 372, pp. 111 - 120, http://dx.doi.org/10.1016/j.surfcoat.2019.05.041
,2019, 'Reactive intercalation and oxidation at the buried graphene-germanium interface', APL Materials, 7, http://dx.doi.org/10.1063/1.5098351
,2019, 'Enhanced Ion Yields Using High Energy Water Cluster Beams for Secondary Ion Mass Spectrometry Analysis and Imaging', Analytical Chemistry, 91, pp. 9058 - 9068, http://dx.doi.org/10.1021/acs.analchem.9b01390
,2019, 'The organic stratigraphy of Ontong Java Plateau Tuff correlated with the depth-related presence and absence of putative microbial alteration structures', Geobiology, 17, pp. 281 - 293, http://dx.doi.org/10.1111/gbi.12326
,2019, 'Enhanced selectivity of carbonaceous products from electrochemical reduction of CO
2019, 'Novel rhodium on carbon catalysts for the oxidation of benzyl alcohol to benzaldehyde: A study of the modification of metal/support interactions by acid pre-treatments', Applied Catalysis A: General, 570, pp. 271 - 282, http://dx.doi.org/10.1016/j.apcata.2018.11.006
,2019, 'Combining thermal hydrolysis and methylation-gas chromatography/mass spectrometry with X-ray photoelectron spectroscopy to characterise complex organic assemblages in geological material', MethodsX, 6, pp. 2646 - 2655, http://dx.doi.org/10.1016/j.mex.2019.10.034
,2018, 'Observing the evolution of regular nanostructured indium phosphide after gas cluster ion beam etching', Applied Surface Science, 459, pp. 678 - 685, http://dx.doi.org/10.1016/j.apsusc.2018.07.195
,2018, 'Practical estimation of XPS binding energies using widely available quantum chemistry software', Surface and Interface Analysis, 50, pp. 5 - 12, http://dx.doi.org/10.1002/sia.6319
,2017, 'Demonstration of chemistry at a point through restructuring and catalytic activation at anchored nanoparticles', Nature Communications, 8, http://dx.doi.org/10.1038/s41467-017-01880-y
,2017, 'Decontamination of geological samples by gas cluster ion beam etching or ultra violet/ozone', Chemical Geology, 466, pp. 256 - 262, http://dx.doi.org/10.1016/j.chemgeo.2017.06.016
,2017, 'Voltage Controlled Hot Carrier Injection Enables Ohmic Contacts Using Au Island Metal Films on Ge', ACS Applied Materials and Interfaces, 9, pp. 27357 - 27364, http://dx.doi.org/10.1021/acsami.7b06595
,2017, 'The plasmonic properties of argon cluster-bombarded InP surfaces', Applied Physics Letters, 111, http://dx.doi.org/10.1063/1.4993535
,2017, 'Erratum: “Visible wavelength surface-enhanced Raman spectroscopy from In-InP nanopillars for biomolecule detection” [Appl. Phys. Lett. 109, 253105 (2016)]', Applied Physics Letters, 110, http://dx.doi.org/10.1063/1.4979551
,2017, 'In situ ion beam sputter deposition and X-ray photoelectron spectroscopy (XPS) of multiple thin layers under computer control for combinatorial materials synthesis', Surface and Interface Analysis, 49, pp. 18 - 24, http://dx.doi.org/10.1002/sia.6045
,2017, 'Water as a catalytic switch in the oxidation of aryl alcohols by polymer incarcerated rhodium nanoparticles', Catalysis Science and Technology, 7, pp. 3985 - 3998, http://dx.doi.org/10.1039/c7cy01006k
,2016, 'Visible wavelength surface-enhanced Raman spectroscopy from In-InP nanopillars for biomolecule detection', Applied Physics Letters, 109, http://dx.doi.org/10.1063/1.4972558
,2016, 'Multispectral optical imaging combined in situ with XPS or ToFSIMS and principal component analysis', Surface and Interface Analysis, 48, pp. 1370 - 1378, http://dx.doi.org/10.1002/sia.6046
,2016, 'Rapid multivariate analysis of 3D ToF-SIMS data: graphical processor units (GPUs) and low-discrepancy subsampling for large-scale principal component analysis', Surface and Interface Analysis, 48, pp. 1328 - 1336, http://dx.doi.org/10.1002/sia.6042
,2016, 'Chemically specific identification of carbon in XPS imaging using Multivariate Auger Feature Imaging (MAFI)', Carbon, 107, pp. 190 - 197, http://dx.doi.org/10.1016/j.carbon.2016.05.073
,2016, 'Removing Beam Current Artifacts in Helium Ion Microscopy: A Comparison of Image Processing Techniques', Microscopy and Microanalysis, 22, pp. 939 - 947, http://dx.doi.org/10.1017/S1431927616011673
,2016, 'Gas cluster ion beam for the characterization of organic materials in submarine basalts as Mars analogs', Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, 34, http://dx.doi.org/10.1116/1.4954940
,2016, 'Optimal conditions for gas cluster ion beams in studying inorganic interface species: improved chemical information at a ZnO interface', Surface and Interface Analysis, 48, pp. 575 - 579, http://dx.doi.org/10.1002/sia.5949
,2016, 'Surface analysis characterisation of gum binders used in modern watercolour paints', Applied Surface Science, 364, pp. 870 - 877, http://dx.doi.org/10.1016/j.apsusc.2015.12.162
,2015, 'Multivariate analysis of extremely large ToFSIMS imaging datasets by a rapid PCA method', Surface and Interface Analysis, 47, pp. 986 - 993, http://dx.doi.org/10.1002/sia.5800
,2015, 'Multivariate auger feature imaging (MAFI) - A new approach towards chemical state identification of novel carbons in XPS imaging', Surface and Interface Analysis, 47, pp. 173 - 175, http://dx.doi.org/10.1002/sia.5738
,2014, 'Oxygen reduction reaction by electrochemically reduced graphene oxide', Faraday Discussions, 173, pp. 415 - 428, http://dx.doi.org/10.1039/c4fd00088a
,2014, 'Multivariate analysis studies of the ageing effect for artist's oil paints containing modern organic pigments', Surface and Interface Analysis, 46, pp. 786 - 790, http://dx.doi.org/10.1002/sia.5467
,2014, 'A three-dimensional Mn
2014, 'Observed damage during Argon gas cluster depth profiles of compound semiconductors', Journal of Applied Physics, 116, http://dx.doi.org/10.1063/1.4892097
,2014, 'The Effect of Temperature and Agitation on Polyethyleneimine Adsorption on Iron Oxide Magnetic Nanoparticles in the Synthesis of Iron Oxide-Au Core–Shell Nanoparticles', Advanced Science, Engineering and Medicine, 6, pp. 531 - 537, http://dx.doi.org/10.1166/asem.2014.1492
,2014, 'Recent developments in the study of the surface-stability of platinum and platinum-iridium mass standards', Johnson Matthey Technology Review, 58, pp. 180 - 188, http://dx.doi.org/10.1595/147106714X684551
,2013, 'Depth profiling organic/inorganic interfaces by argon gas cluster ion beams: Sputter yield data for biomaterials, in-vitro diagnostic and implant applications', Surface and Interface Analysis, 45, pp. 1859 - 1868, http://dx.doi.org/10.1002/sia.5333
,2013, 'Stability of reference masses: VI. Mercury and carbonaceous contamination on platinum weights manufactured at a similar time as the international and national prototype kilograms', Metrologia, 50, pp. 518 - 531, http://dx.doi.org/10.1088/0026-1394/50/5/518
,2013, 'Stability of reference masses: VII. Cleaning methods in air and vacuum applied to a platinum mass standard similar to the international and national kilogram prototypes', Metrologia, 50, pp. 532 - 538, http://dx.doi.org/10.1088/0026-1394/50/5/532
,2013, 'Accurate argon cluster-ion sputter yields: Measured yields and effect of the sputter threshold in practical depth-profiling by x-ray photoelectron spectroscopy and secondary ion mass spectrometry', Journal of Applied Physics, 114, http://dx.doi.org/10.1063/1.4823815
,2013, 'A compact torsional reference device for easy, accurate and traceable AFM piconewton calibration', Nanotechnology, 24, http://dx.doi.org/10.1088/0957-4484/24/33/335706
,2013, 'Local solid phase growth of few-layer graphene on silicon carbide from nickel silicide supersaturated with carbon', Journal of Applied Physics, 113, http://dx.doi.org/10.1063/1.4795501
,2013, 'Material dependence of argon cluster ion sputter yield in polymers: Method and measurements of relative sputter yields for 19 polymers', Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, 31, http://dx.doi.org/10.1116/1.4791669
,2013, 'Observations on X-ray enhanced sputter rates in argon cluster ion sputter depth profiling of polymers', Surface and Interface Analysis, 45, pp. 601 - 604, http://dx.doi.org/10.1002/sia.5198
,2013, 'Stability of reference masses V: UV/ozone treatment of gold and platinum surfaces', Metrologia, 50, pp. 27 - 36, http://dx.doi.org/10.1088/0026-1394/50/1/27
,2013, 'Optimising the growth of few-layer graphene on silicon carbide by nickel silicidation', Materials Science Forum, 740-742, pp. 121 - 124, http://dx.doi.org/10.4028/www.scientific.net/MSF.740-742.121
,2013, 'X-ray enhanced sputter rates in argon cluster ion sputter-depth profiling of polymers', Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics, 31, http://dx.doi.org/10.1116/1.4793284
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