Select Publications

Journal articles

Bhoopathy R; Kunz O; Juhl M; Trupke T; Hameiri Z, 2020, 'Outdoor photoluminescence imaging of solar panels by contactless switching: Technical considerations and applications', Progress in Photovoltaics: research and applications, http://dx.doi.org/10.1002/pip.3216

Rey G; Trupke T; Paduthol A; Sun K; Nagle T; Poplavskyy D; Escalant VS; Melchiorre M; Siebentritt S; Abbott M, 2020, 'Photoluminescence-Based Method for Imaging Buffer Layer Thickness in CIGS Solar Cells', IEEE Journal of Photovoltaics, vol. 10, pp. 181 - 187, http://dx.doi.org/10.1109/JPHOTOV.2019.2950630

Zafirovska I; Juhl MK; Ciesla A; Evans R; Trupke T, 2019, 'Low temperature sensitivity of implied voltages from luminescence measured on crystalline silicon solar cells', Solar Energy Materials and Solar Cells, vol. 199, pp. 50 - 58, http://dx.doi.org/10.1016/j.solmat.2019.04.009

Chin RL; Pollard M; Trupke T; Hameiri Z, 2019, 'Numerical simulations of two-photon absorption time-resolved photoluminescence to extract the bulk lifetime of semiconductors under varying surface recombination velocities', Journal of Applied Physics, vol. 125, pp. 105703 - 105703, http://dx.doi.org/10.1063/1.5037130

Heinz FD; Zhu Y; Hameiri Z; Juhl M; Trupke T; Schubert MC, 2019, 'Correction to: The Principle of Adaptive Excitation for Photoluminescence Imaging of Silicon: Theory (physica status solidi (RRL) - Rapid Research Letters, (2018), 12, 7, (1800137), 10.1002/pssr.201800137)', Physica Status Solidi - Rapid Research Letters, vol. 13, http://dx.doi.org/10.1002/pssr.201900076

Paduthol A; Juhl MK; Nogay G; Löper P; Ingenito A; Trupke T, 2018, 'Impact of different capping layers on carrier injection efficiency between amorphous and crystalline silicon measured using photoluminescence', Solar Energy Materials and Solar Cells, vol. 187, pp. 55 - 60, http://dx.doi.org/10.1016/j.solmat.2018.07.016

Paduthol A; Juhl MK; Nogay G; Löper P; Trupke T, 2018, 'Measuring carrier injection from amorphous silicon into crystalline silicon using photoluminescence', Progress in Photovoltaics: Research and Applications, vol. 26, pp. 968 - 973, http://dx.doi.org/10.1002/pip.3042

Altermatt PP; Xiong Z; He QX; Deng WW; Ye F; Yang Y; Chen Y; Feng ZQ; Verlinden PJ; Liu A; Macdonald DH; Luka T; Lausch D; Turek M; Hagendorf C; Wagner-Mohnsen H; Schön J; Kwapil W; Frühauf F; Breitenstein O; Looney EE; Buonassisi T; Needleman DB; Jackson CM; Arehart AR; Ringel SA; McIntosh KR; Abbott MD; Sudbury BA; Zuschlag A; Winter C; Skorka D; Hahn G; Chung D; Mitchell B; Geelan-Small P; Trupke T, 2018, 'High-performance p-type multicrystalline silicon (mc-Si): Its characterization and projected performance in PERC solar cells', Solar Energy, vol. 175, pp. 68 - 74, http://dx.doi.org/10.1016/j.solener.2018.01.073

Dumbrell R; Juhl MK; Trupke T; Hameiri Z, 2018, 'Extracting metal contact recombination parameters from effective lifetime data', IEEE Journal of Photovoltaics, vol. 8, pp. 1413 - 1420, http://dx.doi.org/10.1109/JPHOTOV.2018.2861761

Chung D; Mitchell B; Juhl MK; Abbott M; Trupke T, 2018, 'Lifetime imaging on silicon bricks using the ratio of photoluminescence images with different excitation wavelengths', IEEE Journal of Photovoltaics, vol. 8, pp. 943 - 951, http://dx.doi.org/10.1109/JPHOTOV.2018.2831449

Heinz FD; Zhu Y; Hameiri Z; Juhl MK; Trupke T; Schubert MC, 2018, 'The principle of adaptive excitation for photoluminescence imaging of silicon: Theory', Physica Status Solidi - Rapid Research Letters, vol. 12, pp. 1800137 - 1800137, http://dx.doi.org/10.1002/pssr.201800137

Paduthol A; Juhl MK; Trupke T, 2018, 'Correcting the Effect of LED Spectra on External Quantum Efficiency Measurements of Solar Cells', IEEE Journal of Photovoltaics, vol. 8, pp. 559 - 564, http://dx.doi.org/10.1109/JPHOTOV.2017.2787022

Paduthol A; Juhl MK; Trupke T, 2018, 'Addressing limitations of photoluminescence based external quantum efficiency measurements', Journal of Applied Physics, vol. 123, http://dx.doi.org/10.1063/1.5004193

Bhoopathy R; Kunz O; Juhl M; Trupke T; Hameiri Z, 2018, 'Outdoor photoluminescence imaging of photovoltaic modules with sunlight excitation', Progress in Photovoltaics: Research and Applications, vol. 26, pp. 69 - 73, http://dx.doi.org/10.1002/pip.2946

Iskra Z; Juhl MK; Weber JW; Wong J; Trupke T, 2017, 'Detection of Finger Interruptions in Silicon Solar Cells Using Line Scan Photoluminescence Imaging', IEEE Journal of Photovoltaics, vol. 7, pp. 1496 - 1502, http://dx.doi.org/10.1109/JPHOTOV.2017.2732220

Mitchell B; Chung D; He Q; Zhang H; Xiong Z; Altermatt PP; Geelan-Small P; Trupke T, 2017, 'PERC Solar Cell Performance Predictions from Multicrystalline Silicon Ingot Metrology Data', IEEE Journal of Photovoltaics, vol. 7, pp. 1619 - 1626, http://dx.doi.org/10.1109/JPHOTOV.2017.2756060

Chung D; Mitchell B; Goodarzi M; Sinton RA; Macdonald D; Trupke T, 2017, 'Uncertainty in Photoluminescence Metrology on Multicrystalline Silicon Bricks and Cross Validation with Wafers', IEEE Journal of Photovoltaics, vol. 7, pp. 1701 - 1709, http://dx.doi.org/10.1109/JPHOTOV.2017.2754059

Nguyen HT; Johnston S; Paduthol A; Harvey SP; Phang SP; Samundsett C; Sun C; Yan D; Trupke T; Al-Jassim MM; Macdonald D, 2017, 'Quantification of Sheet Resistance in Boron-Diffused Silicon Using Micro-Photoluminescence Spectroscopy at Room Temperature', Solar RRL, vol. 1, http://dx.doi.org/10.1002/solr.201700088

Juhl MK; Abbott MD; Trupke T, 2017, 'Relative External Quantum Efficiency of Crystalline Silicon Wafers from Photoluminescence', IEEE Journal of Photovoltaics, vol. 7, pp. 1074 - 1080, http://dx.doi.org/10.1109/JPHOTOV.2017.2697313

Chung D; Mitchell B; Goodarzi M; Sun C; Macdonald D; Trupke T, 2017, 'Bulk Lifetimes up to 20 ms Measured on Unpassivated Silicon Discs Using Photoluminescence Imaging', IEEE Journal of Photovoltaics, vol. 7, pp. 444 - 449, http://dx.doi.org/10.1109/JPHOTOV.2016.2644984

Dumbrell R; Juhl MK; Trupke T; Hameiri Z, 2017, 'Comparison of terminal and implied open-circuit voltage measurements', IEEE Journal of Photovoltaics, vol. 7, pp. 1376 - 1383, http://dx.doi.org/10.1109/JPHOTOV.2017.2729889

Zhu Y; Juhl MK; Trupke T; Hameiri Z, 2017, 'Photoluminescence imaging of silicon wafers and solar cells with spatially inhomogeneous illumination', IEEE Journal of Photovoltaics, vol. 7, pp. 1087 - 1087, http://dx.doi.org/10.1109/JPHOTOV.2017.2690875

Juhl MK; Trupke T, 2016, 'The impact of voltage independent carriers on implied voltage measurements on silicon devices', Journal of Applied Physics, vol. 120, http://dx.doi.org/10.1063/1.4965698

Chung D; Mitchell B; Weber JW; Yager N; Trupke T, 2016, 'Photoluminescence imaging for quality control in silicon solar cell manufacturing', MRS Advances, vol. 1, pp. 3247 - 3256, http://dx.doi.org/10.1557/adv.2016.424

Hameiri Z; Mahboubi Soufiani A; Juhl MK; Jiang LC; Huang FZ; Cheng YB; Kampwerth H; Weber J; Green M; Trupke T, 2015, 'Photoluminescence and electroluminescence imaging of perovskite solar cells', Progress in Photovoltaics: Research and Applications, vol. 23, pp. 1697 - 1705, http://dx.doi.org/10.1002/pip.2716

Juhl MK; Trupke T; Abbott M; Mitchell B, 2015, 'Spatially Resolved Absorptance of Silicon Wafers from Photoluminescence Imaging', IEEE Journal of Photovoltaics, vol. 5, pp. 1840 - 1843, http://dx.doi.org/10.1109/JPHOTOV.2015.2470095

Sio HC; Phang SP; Trupke T; MacDonald D, 2015, 'Impact of Phosphorous Gettering and Hydrogenation on the Surface Recombination Velocity of Grain Boundaries in p-Type Multicrystalline Silicon', IEEE Journal of Photovoltaics, vol. 5, pp. 1357 - 1365, http://dx.doi.org/10.1109/JPHOTOV.2015.2455341

Sio HC; Trupke T; Macdonald D, 2014, 'Quantifying carrier recombination at grain boundaries in multicrystalline silicon wafers through photoluminescence imaging', Journal of Applied Physics, vol. 116, http://dx.doi.org/10.1063/1.4904963

Hallam B; Tjahjono B; Trupke T; Wenham S, 2014, 'Erratum: Photoluminescence imaging for determining the spatially resolved implied open circuit voltage of silicon solar cells (Journal of Applied Physics (2014) 115 (044901))', Journal of Applied Physics, vol. 115, http://dx.doi.org/10.1063/1.4884755

Hameiri Z; Rougieux F; Sinton R; Trupke T, 2014, 'Contactless determination of the carrier mobility sum in silicon wafers using combined photoluminescence and photoconductance measurements', Applied Physics Letters, vol. 104, pp. 073506, http://dx.doi.org/10.1063/1.4865804

Chao Shen CS; Martin A. Green MAG; Otwin Breitenstein OB; Thorsten Trupke TT; Muye Zhang ; Kampwerth H, 2014, 'Improved local efficiency imaging via photoluminescence for silicon solar cells', Solar energy Materials & Solar Cells, vol. 123, pp. 41 - 46, http://dx.doi.org/10.1016/j.solmat.2014.01.003

Sio HC; Phang SP; Trupke T; Macdonald D, 2014, 'An accurate method for calibrating photoluminescence-based lifetime images on multi-crystalline silicon wafers', Solar Energy Materials and Solar Cells, vol. 131, pp. 77 - 84, http://dx.doi.org/10.1016/j.solmat.2014.06.004

Mitchell B; MacDonald D; Schon J; Weber JW; Wagner H; Trupke T, 2014, 'Imaging as-grown interstitial iron concentration on boron-doped silicon bricks via spectral photoluminescence', IEEE Journal of Photovoltaics, vol. 4, pp. 1185 - 1196, http://dx.doi.org/10.1109/JPHOTOV.2014.2326714

Hallam B; Augarten Y; Tjahjono B; Trupke T; Wenham S, 2014, 'Photoluminescence imaging for determining the spatially resolved implied open circuit voltage of silicon solar cells', Journal of Applied Physics, vol. 115, http://dx.doi.org/10.1063/1.4862957

Walter D; Fell A; Franklin E; MacDonald D; Mitchell B; Trupke T, 2014, 'The impact of silicon CCD photon spread on quantitative analyses of luminescence images', IEEE Journal of Photovoltaics, vol. 4, pp. 368 - 373, http://dx.doi.org/10.1109/JPHOTOV.2013.2287912

Sio HC; Phang SP; Trupke T; Macdonald D, 2014, 'An accurate method for calibrating photoluminescence-based lifetime images on multi-crystalline silicon wafers', Solar Energy Materials and Solar Cells, http://dx.doi.org/10.1016/j.solmat.2014.06.004

Augarten Y; Trupke T; Lenio M; Bauer J; Weber JW; Juhl M; Kasemann M; Breitenstein O, 2013, 'Calculation of quantitative shunt values using photoluminescence imaging', Progress in Photovoltaics: Research and Applications, vol. 21, pp. 933 - 941, http://dx.doi.org/10.1002/pip.2180

Mitchell B; Wagner H; Altermatt PP; Trupke T, 2013, 'Predicting solar cell efficiencies from bulk lifetime images of multicrystalline silicon bricks', Energy Procedia, vol. 38, pp. 147 - 152, http://dx.doi.org/10.1016/j.egypro.2013.07.261

Juhl M; Chan C; Abbott MD; Trupke T, 2013, 'Anomalously high lifetimes measured by quasi-steady-state photoconductance in advanced solar cell structures', Applied Physics Letters, vol. 103, pp. - - -, http://dx.doi.org/10.1063/1.4840337

Hameiri Z; Trupke T; Gao N; Sinton RA; Weber JW, 2013, 'Effective bulk doping concentration of diffused and undiffused silicon wafers obtained from combined photoconductance and photoluminescence measurements', Progress in Photovoltaics: Research and Applications, vol. 21, pp. 942 - 949, http://dx.doi.org/10.1002/pip.2184

Mitchell B; Juhl M; Green MA; Trupke T, 2013, 'Full spectrum photoluminescence lifetime analyses on silicon bricks', IEEE journal of photovoltaics, vol. 3, pp. 962 - 969, http://dx.doi.org/10.1109/JPHOTOV.2013.2259894

Trupke T; Macdonald D, 2012, 'Imaging crystal orientations in multicrystalline silicon wafers via photoluminescence', Applied Physics Letters, vol. 101, pp. 082102, http://dx.doi.org/10.1063/1.4747801

Trupke T; Sinton R, 2012, 'Limitations on dynamic excess carrier lifetime calibration methods', Progress in Photovoltaics: Research and Applications, vol. 20, pp. 246 - 249, http://dx.doi.org/10.1002/pip.1119

Mitchell B; Weber JW; Walter D; Macdonald D; Trupke T, 2012, 'On the method of photoluminescence spectral intensity ratio imaging of silicon bricks: Advances and limitations', Journal of Applied Physics, vol. 112, pp. Art. No. 063116, http://dx.doi.org/10.1063/1.4752409

Mitchell B; Greulich J; Trupke T, 2012, 'Quantifying the effect of minority carrier diffusion and free carrier absorption on photoluminescence bulk lifetime imaging of silicon bricks', Solar Energy Materials and Solar Cells, vol. 107, pp. 75 - 80, http://dx.doi.org/10.1016/j.solmat.2012.07.022

Trupke T; Cuevas A; Macdonald D, 2011, 'Dopant concentration imaging in crystalline silicon wafers by band-to-band photoluminescence', Journal of Applied Physics, vol. 110, pp. 113712

Peloso MP; Lew JS; Trupke T; Peters M; Utama R; Aberle AG, 2011, 'Evaluating the electrical properties of silicon wafer solar cells using hyperspectral imaging of luminescence,', Applied Physics Letters, vol. 99, pp. 221915, http://dx.doi.org/10.1063/1.3664134

Trupke T; Nyhus J; Haunschild J, 2011, 'Luminescence imaging for inline characterisation in silicon photovoltaics', Physica Status Solidi (Rapid Research Letters), vol. 5, pp. 131 - 137, http://dx.doi.org/10.1002/pssr.201084028

Trupke T; Mcmillan W, 2010, 'Photoluminescence imaging speeds solar cell inspection', Laser Focus World, vol. 46, pp. 35 - 41

Trupke T; Weber JW, 2010, 'Luminescence imaging: A powerful characterization tool for photovoltaic applications', Proceedings of SPIE - The International Society for Optical Engineering, vol. 7772, http://dx.doi.org/10.1117/12.862714


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