ORCID as entered in ROS
https://orcid.org/0000-0002-4895-9750
Select Publications
Conference Papers
, 2021, 'High-resolution luminescence imaging using deep learning', Sydney, presented at
, 2021, 'Simplified analysis of internal quantum efficiency using machine learning', Sydney, presented at
, 2021, 'Outdoor Photoluminescence Imaging from Unmanned Aerial Vehicles Alexander', in Scott A; Hameiri Z; Trupke T; Perez-Wurfl I; Kunz O (eds.), Sydney, presented at
, 2021, 'Efficiency prediction of solar cells using photoluminescence images and deep Learning', in Small letters, Online, presented at
, 2021, 'A deep learning approach for loss-analysis from luminescence images', in Conference Record of the IEEE Photovoltaic Specialists Conference, Institute of Electrical and Electronics Engineers (IEEE), Online, pp. 97 - 100, presented at
, 2021, 'Localization of defects in solar cells using luminescence images and deep learning', in Conference Record of the IEEE Photovoltaic Specialists Conference, Institute of Electrical and Electronics Engineers (IEEE), Online, pp. 745 - 749, presented at
, 2021, 'High Throughput Outdoor Photoluminescence Imaging via PV String Modulation', in Conference Record of the IEEE Photovoltaic Specialists Conference, pp. 346 - 350, http://dx.doi.org/10.1109/PVSC43889.2021.9519109
, 2021, 'Temperature-dependent performance of silicon wafers: the impact of gettering and hydrogen passivation', Online, presented at
, 2021, 'Luminescence imaging: Outdoor module inspection in full daylight', SPIE, Online, presented at
, 2020, 'Deep learning on electroluminescence images for end-of-line binning of full and half-cut cells', Online, presented at
, 2020, 'Insights into surface recombination of polycrystalline perovskite films via injection-dependent lifetime analysis', Online, presented at
, 2020, 'Temperature-dependent photoluminescence imaging using non-uniform excitation', in Conference Record of the IEEE Photovoltaic Specialists Conference, Institute of Electrical and Electronics Engineers (IEEE), Virtual, pp. 0789 - 0792, presented at
, 2020, 'End-of-line binning of full and half-cut cells using deep learning on electroluminescence images', in Conference Record of the IEEE Photovoltaic Specialists Conference, Institute of Electrical and Electronics Engineers (IEEE), Virtual, pp. 0133 - 0138, presented at
, 2020, 'Outdoor PL imaging of crystalline silicon modules at constant operating point', Virtual, pp. 2140 - 2143, presented at
, 2020, 'Line scanning photoluminescence imaging to study the effects of heat stress in thin-film modules', in 2020 47TH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), IEEE, ELECTR NETWORK, pp. 384 - 388, presented at
, 2020, 'Line scanning photoluminescence imaging to study the effects of heat stress in thin-film modules', in Conference Record of the IEEE Photovoltaic Specialists Conference, pp. 0384 - 0388, http://dx.doi.org/10.1109/PVSC45281.2020.9300999
, 2019, 'Outdoor non-contact measurement of pseudo I-V curves of solar cells in a module', Canberra, presented at
, 2019, 'Deep learning on electroluminescence imaging for end-of-line cell binning', Xi'an, Shaanxi, China, presented at
, 2019, 'Application of suns-photoluminescence to extract implied
I-V curves of individual cells in modules installed in the
field', Marseille, France, presented at
, 2019, 'A novel method for characterizing temperature sensitivity of silicon wafers and cells', Chicago, USA, presented at
, 2019, 'A simplified contactless method for outdoor photoluminescence imaging', in Conference Record of the IEEE Photovoltaic Specialists Conference, Institute of Electrical and Electronics Engineers (IEEE), Chicago, USA, pp. 2571 - 2574, presented at
, 2019, 'Investigating metal-semiconductor contacts in solar cells using magnetic field measurements', in Conference Record of the IEEE Photovoltaic Specialists Conference, pp. 2764 - 2768, http://dx.doi.org/10.1109/PVSC40753.2019.8980686
, 2019, 'Magnetic Field Imaging: Strengths and limitations in characterising solar cells', in Conference Record of the IEEE Photovoltaic Specialists Conference, pp. 822 - 824, http://dx.doi.org/10.1109/PVSC40753.2019.8980950
, 2018, 'Photoluminescence imaging of field deployed modules using contactless switching', Sydney, presented at
, 2018, 'Effect of wafer position in ingot on the light and elevated temperature induced degradation (LeTID) of multicrystalline silicon', in 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC, pp. 303 - 308, http://dx.doi.org/10.1109/PVSC.2018.8547497
, 2018, 'Photoluminescence based characterization techniques for photovoltaic modules in the field', Winter Park, Colorado, presented at
, 2018, 'Determining limits of two-photon time-resolved photoluminescence for measuring bulk lifetime in semiconductors', Hawaii, presented at
, 2018, 'Carrier injection from amorphous silicon into crystalline silicon determined with photoluminescence', in 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC, Institute of Electrical and Electronics Engineers (IEEE), HI, Waikoloa, pp. 3746 - 3750, presented at
, 2018, 'Comparison of Line Scan Luminescence Imaging Techniques for Defect Characterisation in Crystalline Silicon Solar Modules', in 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC, Institute of Electrical and Electronics Engineers (IEEE), HI, Waikoloa, pp. 1364 - 1369, presented at
, 2018, 'Influence of Multicrystalline Silicon Ingot Properties on the Fill Factor of PERC Solar Cells', in 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC, Institute of Electrical and Electronics Engineers (IEEE), pp. 62 - 65, presented at
, 2018, 'Limitations of photoluminescence based external quantum efficiency measurements', in 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC, Institute of Electrical and Electronics Engineers (IEEE), HI, Waikoloa, pp. 2224 - 2228, presented at
, 2018, 'Contactless extraction of implied I-V curves of individual solar cells in fully assembled modules using photoluminescence', Hawaii, USA, presented at
, 2018, 'Extracting surface saturation current density from lifetime measurements of samples with metallized surfaces', in 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC, Institute of Electrical and Electronics Engineers (IEEE), Hawaii, USA, pp. 3243 - 3247, presented at
, 2018, 'Inspecting series resistance effects and bypass diode failure using contactless outdoor photoluminescence imaging', in 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC, Institute of Electrical and Electronics Engineers (IEEE), Hawaii, USA, pp. 377 - 380, presented at
, 2018, 'Effect of wafer position in ingot on the light and elevated temperature induced degradation (LeTID) of multicrystalline silicon', in 2018 IEEE 7TH WORLD CONFERENCE ON PHOTOVOLTAIC ENERGY CONVERSION (WCPEC) (A JOINT CONFERENCE OF 45TH IEEE PVSC, 28TH PVSEC & 34TH EU PVSEC), IEEE, HI, Waikoloa, pp. 0303 - 0308, presented at
, 2018, 'Influence of Multicrystalline Silicon Ingot Properties on the Fill Factor of PERC Solar Cells', in 2018 IEEE 7TH WORLD CONFERENCE ON PHOTOVOLTAIC ENERGY CONVERSION (WCPEC) (A JOINT CONFERENCE OF 45TH IEEE PVSC, 28TH PVSEC & 34TH EU PVSEC), IEEE, HI, Waikoloa, pp. 0062 - 0065, presented at
, 2018, 'Inspecting series resistance effects and bypass diode failure using contactless outdoor photoluminescence imaging', IEEE, Waikoloa, HI, pp. 0377 - 0380, presented at
, 2018, 'Progress in photoluminescence-based characterisation of silicon bricks, wafers and modules', Sweden, presented at
, 2018, 'Outdoor and indoor luminescence imaging of photovoltaic modules', Denver, USA, presented at
, 2017, 'Numerical modeling of two-photon photoluminescence in semiconductors for probing bulk and surface kinetics', Shiga, Japan, presented at
, 2017, 'Outdoor photoluminescence measurements of photovoltaic modules under full sunlight illumination', Shiga, Japan, presented at
, 2017, 'Photoluminescence imaging at uniform excess carrier density using non uniform illumination', in IEEE Journal of Photovoltaics, Institute of Electrical and Electronics Engineers (IEEE), Shiga, Japan, pp. 1787 - 1792, presented at
, 2017, 'Efficient Detection of Finger Interruptions from Photoluminescence Images', in Efficient Detection of Finger Interruptions from Photoluminescence Images, Amsterdam, The Netherlands, pp. 1689 - 1693, presented at
, 2017, 'Applications of DMD-based inhomogeneous illumination photoluminescence imaging for silicon wafers and solar cells', in 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017, Institute of Electrical and Electronics Engineers (IEEE), Washington D.C., pp. 66 - 69, presented at
, 2017, 'Metal induced contact recombination measured by quasi-steady-state photoluminescence', in 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017, Institute of Electrical and Electronics Engineers (IEEE), Washington, DC, pp. 3315 - 3318, presented at
, 2017, 'On the use of voltage measurements for determining carrier lifetime at high illumination intensity', in 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017, Institute of Electrical and Electronics Engineers (IEEE), Washington, DC, pp. 1 - 4, presented at
, 2017, 'A comparison between quasi-steady state and transient photoconductance lifetimes in silicon ingots: simulations and measurements', in 2017 IEEE 44TH PHOTOVOLTAIC SPECIALIST CONFERENCE (PVSC), IEEE, DC, Washington, pp. 2707 - 2710, presented at
, 2017, 'Estimating the effect of LED spectra on EQE measurement in solar cells', in 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017, Institute of Electrical and Electronics Engineers (IEEE), pp. 1169 - 1174, presented at
, 2016, 'Effective lifetime of full rear metallized cells by quasi-steady-state photoluminescence', Singapore, presented at
, 2016, 'Module Inspection Using Line Scanning Photoluminescence Imaging', in Module Inspection Using Line Scanning Photoluminescence Imaging, Munich, Germany, presented at
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https://orcid.org/0000-0002-4895-9750