Select Publications
Journal articles
2024, 'Light-activated surface passivation for more efficient silicon heterojunction solar cells: Origin, physics and stability', Solar Energy Materials and Solar Cells, 269, http://dx.doi.org/10.1016/j.solmat.2024.112789
,2024, 'Decarbonising mining of Australia's critical mineral deposits: Opportunities for sustainable mining through solar photovoltaics and wind energy integration', Journal of Cleaner Production, 455, http://dx.doi.org/10.1016/j.jclepro.2024.142300
,2024, 'Reassessing iron-gallium recombination activity in silicon', Journal of Applied Physics, 135, http://dx.doi.org/10.1063/5.0198737
,2024, 'Low-temperature aluminum doped and induced polysilicon and its application as partial rear contacts on p-type silicon solar cells', Solar Energy Materials and Solar Cells, 267, http://dx.doi.org/10.1016/j.solmat.2024.112708
,2024, 'Mitigating parasitic absorption in Poly-Si contacts for TOPCon solar cells: A comprehensive review', Solar Energy Materials and Solar Cells, 267, http://dx.doi.org/10.1016/j.solmat.2024.112704
,2024, 'Accelerated degradation of photovoltaic modules under a future warmer climate', Progress in Photovoltaics: research and applications, 32, pp. 456 - 467, http://dx.doi.org/10.1002/pip.3788
,2023, 'Heat Flow through Nonideal Contacts in Hot-Carrier Solar Cells', Physical Review Applied, 20, http://dx.doi.org/10.1103/PhysRevApplied.20.034001
,2023, 'On the Conversion between Recombination Rates and Electronic Defect Parameters in Semiconductors', IEEE Journal of Photovoltaics, 13, pp. 524 - 534, http://dx.doi.org/10.1109/JPHOTOV.2023.3267173
,2023, 'Nature of contaminants introduced in silicon wafers during molecular beam epitaxy chamber annealing', AIP Advances, 13, http://dx.doi.org/10.1063/5.0117424
,2022, 'Characterisation of striations in n-type silicon wafer processed with polysilicon contacts', Solar Energy Materials and Solar Cells, 248, http://dx.doi.org/10.1016/j.solmat.2022.111965
,2022, 'Electronic Properties of Light- and Elevated Temperature-Induced Degradation in Float-Zone Silicon', IEEE Journal of Photovoltaics, 12, pp. 1369 - 1376, http://dx.doi.org/10.1109/JPHOTOV.2022.3195098
,2022, 'Electronic Properties of the Boron-Oxygen Defect Precursor of the Light-Induced Degradation in Silicon', IEEE Journal of Photovoltaics, 12, pp. 1135 - 1141, http://dx.doi.org/10.1109/JPHOTOV.2022.3190769
,2022, 'Constraints imposed by the sparse solar photon flux on upconversion and hot carrier solar cells', Solar Energy, 237, pp. 44 - 51, http://dx.doi.org/10.1016/j.solener.2022.03.037
,2022, 'Photoluminescence Spectroscopy of Thermal Donors and Oxygen Precipitates Formed in Czochralski Silicon at 450 °c', IEEE Journal of Photovoltaics, 12, pp. 222 - 229, http://dx.doi.org/10.1109/JPHOTOV.2021.3126120
,2021, 'The Mechanism of Surface Passivation Degradation in SiO
2021, 'Ring-Like Defect Formation in N-Type Czochralski-Grown Silicon Wafers during Thermal Donor Formation', Physica Status Solidi (A) Applications and Materials Science, 218, http://dx.doi.org/10.1002/pssa.202000587
,2021, 'On the correlation between light-induced degradation and minority carrier traps in boron-doped Czochralski silicon', ACS Applied Materials & Interfaces, 13, pp. 6140 - 6146, http://dx.doi.org/10.1021/acsami.0c17549
,2021, 'Photoconductance determination of carrier capture cross sections of slow traps in silicon through variable pulse filling', IEEE Journal of Photovoltaics, 11, pp. 273 - 281, http://dx.doi.org/10.1109/JPHOTOV.2020.3043835
,2021, 'The role of charge and recombination-enhanced defect reaction effects in the dissociation of FeB pairs in p-type silicon under carrier injection', Physica Status Solidi - Rapid Research Letters, 15, pp. 2000520 - 2000520, http://dx.doi.org/10.1002/pssr.202000520
,2021, 'Electrical characterization of thermally activated defects in n-type float-zone silicon', IEEE Journal of Photovoltaics, 11, pp. 26 - 35, http://dx.doi.org/10.1109/jphotov.2020.3031382
,2020, 'Design of Ultrathin InP Solar Cell Using Carrier Selective Contacts', IEEE Journal of Photovoltaics, 10, pp. 1657 - 1666, http://dx.doi.org/10.1109/JPHOTOV.2019.2961615
,2020, 'Light-induced-degradation defect independent of the boron concentration: Towards unifying admittance spectroscopy, photoluminescence and photoconductance lifetime spectroscopy results', Solar Energy Materials and Solar Cells, 210, http://dx.doi.org/10.1016/j.solmat.2020.110481
,2020, 'Onset of ring defects in n-type Czochralski-grown silicon wafers', Journal of Applied Physics, 127, http://dx.doi.org/10.1063/5.0005899
,2020, 'Hydrogen-induced degradation: Explaining the mechanism behind light- and elevated temperature-induced degradation in n- and p-type silicon', Solar Energy Materials and Solar Cells, 207, http://dx.doi.org/10.1016/j.solmat.2019.110353
,2020, 'Impact of pre-fabrication treatments on n-type UMG wafers for 21% efficient silicon heterojunction solar cells', Solar Energy Materials and Solar Cells, 205, http://dx.doi.org/10.1016/j.solmat.2019.110287
,2019, 'Contactless transient carrier spectroscopy and imaging technique using lock-in free carrier emission and absorption', Scientific Reports, 9, http://dx.doi.org/10.1038/s41598-019-49804-8
,2019, 'Kinetics and dynamics of the regeneration of boron-oxygen defects in compensated n-type silicon', Solar Energy Materials and Solar Cells, http://dx.doi.org/10.1016/j.solmat.2019.03.016
,2018, 'Ring defects in n-type Czochralski-grown silicon: A high spatial resolution study using Fourier-transform infrared spectroscopy, micro-photoluminescence, and micro-Raman', Journal of Applied Physics, 124, http://dx.doi.org/10.1063/1.5057724
,2018, 'Determining the charge states and capture mechanisms of defects in silicon through accurate recombination analyses: A review', Solar Energy Materials and Solar Cells, 187, pp. 263 - 272, http://dx.doi.org/10.1016/j.solmat.2018.07.029
,2018, 'Indium phosphide based solar cell using ultra-thin ZnO as an electron selective layer', Journal of Physics D: Applied Physics, 51, http://dx.doi.org/10.1088/1361-6463/aad7e3
,2018, 'Methods to improve bulk lifetime in n-type czochralski-grown upgraded metallurgical-grade silicon wafers', IEEE Journal of Photovoltaics, 8, pp. 990 - 996, http://dx.doi.org/10.1109/JPHOTOV.2018.2834944
,2017, 'Carrier induced degradation in compensated n-type silicon solar cells: Impact of light-intensity, forward bias voltage, and temperature on the reaction kinetics', Japanese Journal of Applied Physics, 56, http://dx.doi.org/10.7567/JJAP.56.08MB23
,2017, 'Activation Kinetics of the Boron-oxygen Defect in Compensated n- and p-type Silicon Studied by High-Injection Micro-Photoluminescence', IEEE Journal of Photovoltaics, 7, pp. 988 - 995, http://dx.doi.org/10.1109/JPHOTOV.2017.2705420
,2017, 'Growth of Oxygen Precipitates and Dislocations in Czochralski Silicon', IEEE Journal of Photovoltaics, 7, pp. 735 - 740, http://dx.doi.org/10.1109/JPHOTOV.2017.2678840
,2017, 'Precipitation of Cu and Ni in n- and p-type Czochralski-grown silicon characterized by photoluminescence imaging', Journal of Crystal Growth, 460, pp. 98 - 104, http://dx.doi.org/10.1016/j.jcrysgro.2016.12.084
,2017, '21.1% UMG Silicon Solar Cells', IEEE Journal of Photovoltaics, 7, pp. 58 - 61, http://dx.doi.org/10.1109/JPHOTOV.2016.2616192
,2016, 'Permanent annihilation of thermally activated defects which limit the lifetime of float-zone silicon', Physica Status Solidi (A) Applications and Materials Science, 213, pp. 2844 - 2849, http://dx.doi.org/10.1002/pssa.201600360
,2016, 'Reassessment of the recombination properties of aluminium–oxygen complexes in n- and p-type Czochralski-grown silicon', Physica Status Solidi (B) Basic Research, 253, pp. 2079 - 2084, http://dx.doi.org/10.1002/pssb.201600363
,2016, 'Thermal activation and deactivation of grown-in defects limiting the lifetime of float-zone silicon', Physica Status Solidi - Rapid Research Letters, 10, pp. 443 - 447, http://dx.doi.org/10.1002/pssr.201600080
,2016, 'High efficiency UMG silicon solar cells: Impact of compensation on cell parameters', Progress in Photovoltaics: Research and Applications, 24, pp. 725 - 734, http://dx.doi.org/10.1002/pip.2729
,2016, 'Upgraded metallurgical-grade silicon solar cells with efficiency above 20%', Applied Physics Letters, 108, http://dx.doi.org/10.1063/1.4944788
,2016, 'Characterizing amorphous silicon, silicon nitride, and diffused layers in crystalline siliconsolarcellsusingmicro-photoluminescence spectroscopy', Solar Energy Materials and Solar Cells, 145, pp. 403 - 411, http://dx.doi.org/10.1016/j.solmat.2015.11.006
,2015, 'Charge states of the reactants in the hydrogen passivation of interstitial iron in P-type crystalline silicon', Journal of Applied Physics, 118, http://dx.doi.org/10.1063/1.4929757
,2015, 'Micrometer-Scale Deep-Level Spectral Photoluminescence from Dislocations in Multicrystalline Silicon', IEEE Journal of Photovoltaics, 5, pp. 799 - 804, http://dx.doi.org/10.1109/JPHOTOV.2015.2407158
,2015, 'Influence of annealing and bulk hydrogenation on lifetime-limiting defects in nitrogen-doped floating zone silicon', IEEE Journal of Photovoltaics, 5, pp. 495 - 498, http://dx.doi.org/10.1109/JPHOTOV.2014.2367912
,2015, 'Grown-in defects limiting the bulk lifetime of p -type float-zone silicon wafers', Journal of Applied Physics, 117, http://dx.doi.org/10.1063/1.4907804
,2015, 'A unified approach to modelling the charge state of monatomic hydrogen and other defects in crystalline silicon', Journal of Applied Physics, 117, http://dx.doi.org/10.1063/1.4906465
,2015, 'Evidence for vacancy-related recombination active defects in as-grown N-type czochralski silicon', IEEE Journal of Photovoltaics, 5, pp. 183 - 188, http://dx.doi.org/10.1109/JPHOTOV.2014.2366687
,2015, 'Impact of carrier profile and rear-side reflection on photoluminescence spectra in planar crystalline silicon wafers at different temperatures', IEEE Journal of Photovoltaics, 5, pp. 77 - 81, http://dx.doi.org/10.1109/JPHOTOV.2014.2359737
,2014, 'Reassessment of the recombination parameters of chromium in n- and p-type crystalline silicon and chromium-boron pairs in p-type crystalline silicon', Journal of Applied Physics, 115, http://dx.doi.org/10.1063/1.4881497
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