By Dr Yan Zhu

Conference Papers

Jafari S; Zhu Y; Rougieux F; Hameiri Z, 2019, 'Trapping in multi-crystalline silicon wafers: Impact of laser treatment and firing', Canberra, presented at Asia-Pacific Solar Research Conference, Canberra, 03 December 2019

Zhu Y; Coletti G; Hameiri Z, 2019, 'Injection dependent lifetime spectroscopy for two level defects in silicon', Chicago, USA, presented at 46th IEEE Photovoltaic Specialists Conference, Chicago, USA, 16 June 2019 - 21 July 2019

Zhu Y; Rougieux F; Grant N; Mullins J; Ann De Guzman J; Murphy J; Markevich V; Coletti G; Peaker A; Hameiri Z, 2019, 'New insights into the thermally activated defects in n-type float-zone silicon', Leuven, presented at 9th International Conference on Silicon Photovoltaics, Leuven, 08 April 2019 - 10 April 2019

Rougieux FE; Sun C; Zhu Y; MacDonald DH, 2018, 'Accurate defect recombination parameters: What are the limitations of current analyses?', in 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC, pp. 2520 - 2523, http://dx.doi.org/10.1109/PVSC.2018.8547585

Lee Chin RA; Zhu Y; Coletti G; Binetti S; Pollard M; Hameiri Z, 2018, 'Insights into bulk defect in n-type monocrystalline silicon via temperature-dependent micro-photoluminescence spectroscopy', Hawaii, presented at 7th World Conference on Photovoltaic Energy Conversion, Hawaii, 11 June 2018 - 15 June 2018

Bernardini S; Zhu Y; Nie S; Hameiri Z; Bertoni M, 2018, 'Analysis of SiNx SRV injection- and temperature-dependence and its degradation via TIDLS measurements', Hawaii, presented at 7th World Conference on Photovoltaic Energy Conversion, Hawaii, 10 June 2018 - 15 June 2018

Jensen M; Laine HS; Zhu Y; Vargas C; Liu Z; Li JB; Hameiri Z; Buonassisi T, 2018, 'Investigating the different degradation behavior of multicrystalline silicon PERC and Al-BSF solar cells', Hawaii, presented at 7th World Conference on Photovoltaic Energy Conversion, Hawaii, 10 June 2018 - 15 June 2018

Zhu Y; Juhl MK; Coletti G; Hameiri Z, 2018, 'Reassessment of minority carrier traps in silicon during “quasi-steady-state” photoconductance measurements', in 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC, Institute of Electrical and Electronics Engineers (IEEE), Hawaii, USA, pp. 77 - 80, presented at 7th World Conference on Photovoltaic Energy Conversion, Hawaii, USA, 10 June 2018 - 15 June 2018, http://dx.doi.org/10.1109/PVSC.2018.8547873

Bernardini S; Nie S; Zhu Y; Hameiri Z; Bertoni M, 2018, 'Surface photovoltage spectroscopy as a characterization technique for surface passivation quality assessmen', Hawaii, presented at 7th World Conference on Photovoltaic Energy Conversion, Hawaii, 10 June 2018 - 15 June 2018

Lee Chin R; Zhu Y; Coletti G; Binetti S; Pollard M; Hameiri Z, 2018, 'Insights into striations in n-type Czochralski wafers investigated via low-temperature hyperspectral and temperature-dependent spectral photoluminescence', Japan, presented at 10th International Workshop on Crystalline Silicon for Solar Cells, Japan, 08 April 2018 - 11 April 2018

Jensen M; Zhu Y; Nakajima K; Juhl MK; Youssef E; Looney EE; Hameiri Z; Sander R; Buonassisi T, 2017, 'Defect engineering for material-quality improvements in low-capex crystalline silicon—an application of temperature- and injection-dependent lifetime spectroscopy', Boston, presented at MRS Fall Meeting, Boston, 26 November 2017 - 01 December 2017

Nie S; Zhu Y; Bernardini S; Bertoni M; Hameiri Z, 2017, 'Advanced temperature charctrisation of silicon nitride surface passivation layer', Shiga, Japan, presented at 27th International Photovoltaic Science and Engineering Conference, Shiga, Japan, 12 November 2017 - 17 November 2017

Zhu Y; Juhl M; Coletti G; Hameiri Z, 2017, 'Impact of transient trapping on steady state photoconductance lifetime measurements', Shiga, Japan, presented at 27th International Photovoltaic Science and Engineering Conference, Shiga, Japan, 11 November 2017 - 17 November 2017

Zhu Y; Juhl M; Heinz F; Schubert M; Trupke T; Hameiri Z, 2017, 'Photoluminescence imaging at uniform excess carrier density using non uniform illumination', in IEEE Journal of Photovoltaics, Institute of Electrical and Electronics Engineers (IEEE), Shiga, Japan, pp. 1787 - 1792, presented at 27th International Photovoltaic Science and Engineering Conference, Shiga, Japan, 11 November 2017 - 17 November 2017, http://dx.doi.org/10.1109/JPHOTOV.2018.2869541

Zhu Y; Juhl MK; Trupke T; Hameiri Z, 2017, 'Applications of DMD-based inhomogeneous illumination photoluminescence imaging for silicon wafers and solar cells', in 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017, Institute of Electrical and Electronics Engineers (IEEE), Washington D.C., pp. 66 - 69, presented at 44th IEEE Photovoltaic Specialists Conference, Washington D.C., 25 June 2017 - 30 June 2017, http://dx.doi.org/10.1109/PVSC.2017.8366047

Jensen M; Zhu Y; Looney E; Morishige A; Castrillon C; Hameiri Z; Buonassisi T, 2017, 'Assessing the defect responsible for LeTID: Temperature- and injection-dependent lifetime spectroscopy', in 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017, Institute of Electrical and Electronics Engineers (IEEE), Washington D.C, pp. 3290 - 3294, presented at 44th IEEE Photovoltaic Specialists Conference, Washington D.C, 11 June 2017 - 16 June 2017, http://dx.doi.org/10.1109/PVSC.2017.8366132

Zhu Y; Castrillon CV; Jensen MA; Juhl MK; Coletti G; Hameiri Z, 2016, 'Defect characterization via temperature and injection dependent lifetime spectroscopy', Tempe, Arizona, presented at 9th International Workshop on Crystalline Silicon for Solar Cells and 3rd Silicon Materials Workshop, Tempe, Arizona, 10 October 2016 - 12 October 2016, http://handle.unsw.edu.au/1959.4/unsworks_41897

Preprints

Soufiani AM; Zhu Y; Mussakhanuly N; Yun JS; Trupke T; Hameiri Z, 2021, Contactless Series Resistance Imaging of Perovskite Solar Cells via Inhomogeneous Illumination, http://dx.doi.org/10.48550/arxiv.2109.06971

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