By Dr Yan Zhu

Conference Papers

Jensen M; Zhu Y; Nakajima K; Juhl MK; Youssef E; Looney EE; Hameiri Z; Sander R; Buonassisi T, 2017, 'Defect engineering for material-quality improvements in low-capex crystalline silicon—an application of temperature- and injection-dependent lifetime spectroscopy', Boston, presented at MRS Fall Meeting, Boston, 26 November 2017 - 01 December 2017

Nie S; Zhu Y; Bernardini S; Bertoni M; Hameiri Z, 2017, 'Advanced temperature charctrisation of silicon nitride surface passivation layer', Shiga, Japan, presented at 27th International Photovoltaic Science and Engineering Conference, Shiga, Japan, 12 November 2017 - 17 November 2017

Zhu Y; Juhl M; Coletti G; Hameiri Z, 2017, 'Impact of transient trapping on steady state photoconductance lifetime measurements', Shiga, Japan, presented at 27th International Photovoltaic Science and Engineering Conference, Shiga, Japan, 11 November 2017 - 17 November 2017

Zhu Y; Juhl M; Heinz F; Schubert M; Trupke T; Hameiri Z, 2017, 'Photoluminescence imaging at uniform excess carrier density using non uniform illumination', in IEEE Journal of Photovoltaics, Institute of Electrical and Electronics Engineers (IEEE), Shiga, Japan, pp. 1787 - 1792, presented at 27th International Photovoltaic Science and Engineering Conference, Shiga, Japan, 11 November 2017 - 17 November 2017, http://dx.doi.org/10.1109/JPHOTOV.2018.2869541

Zhu Y; Juhl MK; Trupke T; Hameiri Z, 2017, 'Applications of DMD-based inhomogeneous illumination photoluminescence imaging for silicon wafers and solar cells', in 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017, Institute of Electrical and Electronics Engineers (IEEE), Washington D.C., pp. 66 - 69, presented at 44th IEEE Photovoltaic Specialists Conference, Washington D.C., 25 June 2017 - 30 June 2017, http://dx.doi.org/10.1109/PVSC.2017.8366047

Jensen M; Zhu Y; Looney E; Morishige A; Castrillon C; Hameiri Z; Buonassisi T, 2017, 'Assessing the defect responsible for LeTID: Temperature- and injection-dependent lifetime spectroscopy', in 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017, Institute of Electrical and Electronics Engineers (IEEE), Washington D.C, pp. 3290 - 3294, presented at 44th IEEE Photovoltaic Specialists Conference, Washington D.C, 11 June 2017 - 16 June 2017, http://dx.doi.org/10.1109/PVSC.2017.8366132

Zhu Y; Castrillon CV; Jensen MA; Juhl MK; Coletti G; Hameiri Z, 2016, 'Defect characterization via temperature and injection dependent lifetime spectroscopy', Tempe, Arizona, presented at 9th International Workshop on Crystalline Silicon for Solar Cells and 3rd Silicon Materials Workshop, Tempe, Arizona, 10 October 2016 - 12 October 2016, http://handle.unsw.edu.au/1959.4/unsworks_41897

Preprints

Soufiani AM; Zhu Y; Mussakhanuly N; Yun JS; Trupke T; Hameiri Z, 2021, Contactless Series Resistance Imaging of Perovskite Solar Cells via Inhomogeneous Illumination, http://dx.doi.org/10.48550/arxiv.2109.06971

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