Journal articles
Niu X; Soeriyadi A; He G; McNab S; Lozano-Perez S; Bonilla RS, 2025, 'Oxide-nitride nanolayer stacks for enhanced passivation of p-type surfaces in silicon solar cells', Solar Energy Materials and Solar Cells, 280, http://dx.doi.org/10.1016/j.solmat.2024.113231
McNab S; Morisset A; Libraro S; Genç E; Niu X; Swallow JEN; Wilshaw P; Weatherup RS; Wright M; Haug FJ; Bonilla RS, 2024, 'Hole-Selective SiNx and AlOx Tunnel Nanolayers for Improved Polysilicon Passivating Contacts', ACS Applied Energy Materials, 7, pp. 10259 - 10270, http://dx.doi.org/10.1021/acsaem.4c01170
Grant NE; Pain SL; Khorani E; Jefferies R; Wratten A; McNab S; Walker D; Han Y; Beanland R; Bonilla RS; Murphy JD, 2024, 'Activation of Al2O3 surface passivation of silicon: Separating bulk and surface effects', Applied Surface Science, 645, http://dx.doi.org/10.1016/j.apsusc.2023.158786
Romain X; Wilshaw PR; Stantchev RI; Miao T; Mou S; Niewelt T; McNab S; Pain SL; Grant NE; Bonilla RS; Pickwell-Macpherson E; Murphy JD, 2024, 'Electrically tunable Si-based THz photomodulator using dielectric/polymer surface gating', IEEE Transactions on Terahertz Science and Technology, http://dx.doi.org/10.1109/TTHZ.2024.3477983
Matsui T; Fukaya S; McNab S; McQueen J; Gotoh K; Sai H; Usami N; Bonilla RS, 2024, 'Symmetric Dopant-Free Si Solar Cells Enabled by TiOx Nanolayers: An In-Depth Study on Bipolar Carrier Selectivity', Advanced Science, http://dx.doi.org/10.1002/advs.202410179
Al-Dhahir I; Niu X; Yu M; McNab S; Lin Y; Altermatt PP; Patrick CE; Bonilla RS, 2023, 'Ion-Charged Dielectric Nanolayers for Enhanced Surface Passivation in High Efficiency Photovoltaic Devices', Advanced Materials Interfaces, 10, http://dx.doi.org/10.1002/admi.202300037
Mcnab S; Niu X; Khorani E; Wratten A; Morisset A; Grant NE; Murphy JD; Altermatt PP; Wright M; Wilshaw PR; Bonilla RS, 2023, 'SiNxand AlOxNanolayers in Hole Selective Passivating Contacts for High Efficiency Silicon Solar Cells', IEEE Journal of Photovoltaics, 13, pp. 22 - 32, http://dx.doi.org/10.1109/JPHOTOV.2022.3226706
Matsui T; McNab S; Bonilla RS; Sai H, 2022, 'Full-Area Passivating Hole Contact in Silicon Solar Cells Enabled by a TiOx/Metal Bilayer', ACS Applied Energy Materials, 5, pp. 12782 - 12789, http://dx.doi.org/10.1021/acsaem.2c02392
Al-Dhahir I; Kealy R; Kelly S; Yu M; McNab S; Collett K; Liu J; Grovenor C; Wilshaw PR; Bonilla RS, 2022, 'Electrostatic Tuning of Ionic Charge in SiO2 Dielectric Thin Films', ECS Journal of Solid State Science and Technology, 11, http://dx.doi.org/10.1149/2162-8777/ac7350
Yu M; Shi Y; Deru J; Al-Dhahir I; McNab S; Chen D; Voss M; Hwu ET; Ciesla A; Hallam B; Hamer P; Altermatt PP; Wilshaw P; Bonilla RS, 2021, 'Assessing the Potential of Inversion Layer Solar Cells Based on Highly Charged Dielectric Nanolayers', Physica Status Solidi - Rapid Research Letters, 15, http://dx.doi.org/10.1002/pssr.202100129
Yu M; McNab S; Al-Dhahir I; Patrick CE; Altermatt PP; Bonilla RS, 2021, 'Extracting band-tail interface state densities from measurements and modelling of space charge layer resistance', Solar Energy Materials and Solar Cells, 231, http://dx.doi.org/10.1016/j.solmat.2021.111307
Khorani E; McNab S; Scheul TE; Rahman T; Bonilla RS; Boden SA; Wilshaw PR, 2020, 'Optoelectronic properties of ultrathin ALD silicon nitride and its potential as a hole-selective nanolayer for high efficiency solar cells', APL Materials, 8, http://dx.doi.org/10.1063/5.0023336
Conference Papers
Yu M; Wright M; McNab S; Al-Dhahir I; Altermatt PP; Bonilla RS, 2023, 'Probing the interface state densities near band edges from inductively coupled measurements of sheet resistance', in AIP Conference Proceedings, http://dx.doi.org/10.1063/5.0140389
McNab S; Yu M; Al-Dhahir I; Khorani E; Rahman T; Boden SA; Altermatt PP; Wilshaw PR; Bonilla RS, 2022, 'Alternative Dielectrics for Hole Selective Passivating Contacts and the Influence of Nanolayer Built-in Charge', in AIP Conference Proceedings, http://dx.doi.org/10.1063/5.0089282
Al-Dhahir I; McNab S; Yu M; Shaw E; Hamer P; Bonilla RS, 2022, 'The Influence of Surface Electric Fields on the Chemical Passivation of Si-SiO2 Interfaces after Firing', in AIP Conference Proceedings, http://dx.doi.org/10.1063/5.0089930
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