By Professor Peter Cumpson

Journal articles

Escobedo-Cousin E; Vassilevski K; Hopf T; Wright N; O'Neill A; Horsfall A; Goss J; Cumpson P, 2013, 'Optimising the growth of few-layer graphene on silicon carbide by nickel silicidation', Materials Science Forum, 740-742, pp. 121 - 124, http://dx.doi.org/10.4028/www.scientific.net/MSF.740-742.121

Cumpson PJ; Portoles JF; Sano N; Barlow AJ, 2013, 'X-ray enhanced sputter rates in argon cluster ion sputter-depth profiling of polymers', Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics, 31, http://dx.doi.org/10.1116/1.4793284

Tantra R; Gohil D; Cumpson P, 2009, 'Effective platform for the generation of aerosol droplets and application in evaluating the effectiveness of a MEMS-based nanoparticle trapping device', Particuology, 7, pp. 471 - 476, http://dx.doi.org/10.1016/j.partic.2009.09.006

Herrera-Gomez A; Grant JT; Cumpson PJ; Jenko M; Aguirre-Tostado FS; Brundle CR; Conard T; Conti G; Fadley CS; Fulghum J; Kobayashi K; K̈ov́er L; Nohira H; Opila RL; Oswald S; Paynter RW; Wallace RM; Werner WSM; Wolstenholme J, 2009, 'Report on the 47th IUVSTAworkshop 'angle-resolved XPS: The current status and future prospects for angle-resolved XPS of nano and subnano films'', Surface and Interface Analysis, 41, pp. 840 - 857, http://dx.doi.org/10.1002/sia.3105

Aitken RJ; Hankin SM; Lang Tran C; Donaldson K; Stone V; Cumpson P; Johnstone J; Chaudhry Q; Cash S; Garrod J, 2008, 'A multidisciplinary approach to the identification of reference materials for engineered nanoparticle toxicology', Nanotoxicology, 2, pp. 71 - 78, http://dx.doi.org/10.1080/17435390802109177

Munz M; Cox DC; Cumpson PJ, 2008, 'Nano-scale shear mode testing of the adhesion of nanoparticles to a surface-support', Physica Status Solidi (A) Applications and Materials Science, 205, pp. 1424 - 1428, http://dx.doi.org/10.1002/pssa.200778110

Roy D; Munz M; Colombi P; Bhattacharyya S; Salvetat JP; Cumpson PJ; Saboungi ML, 2007, 'Directly writing with nanoparticles at the nanoscale using dip-pen nanolithography', Applied Surface Science, 254, pp. 1394 - 1398, http://dx.doi.org/10.1016/j.apsusc.2007.06.058

Tantra R; Cumpson P, 2007, 'The detection of airborne carbon nanotubes in relation to toxicology and workplace safety', Nanotoxicology, 1, pp. 251 - 265, http://dx.doi.org/10.1080/17435390701675906

Portolés JF; Cumpson PJ; Hedley J; Allen S; Williams PM; Tendler SJB, 2006, 'Accurate velocity measurements of AFM-cantilever vibrations by doppler interferometry', Journal of Experimental Nanoscience, 1, pp. 51 - 62, http://dx.doi.org/10.1080/17458080500411999

Cumpson PJ; Hedley J; Clifford CA, 2005, 'Microelectromechanical device for lateral force calibration in the atomic force microscope: Lateral electrical nanobalance', Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 23, pp. 1992 - 1997, http://dx.doi.org/10.1116/1.2044809

Sheridan B; Cumpson P; Bailey M, 2005, 'Metrology at the nano scale', Physics World, 18, pp. 37 - 40, http://dx.doi.org/10.1088/2058-7058/18/8/35

Cumpson PJ; Zhdan P; Hedley J, 2004, 'Calibration of AFM cantilever stiffness: A microfabricated array of reflective springs', Ultramicroscopy, 100, pp. 241 - 251, http://dx.doi.org/10.1016/j.ultramic.2003.10.005

Cumpson PJ; Hedley J; Clifford CA; Chen X; Allen S, 2004, 'Microelectromechanical system device for calibration of atomic force microscope cantilever spring constants between 0.01 and 4 N/m', Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, 22, pp. 1444 - 1449, http://dx.doi.org/10.1116/1.1763898

Cumpson PJ; Clifford CA; Hedley J, 2004, 'Quantitative analytical atomic force microscopy: A cantilever reference device for easy and accurate AFM spring-constant calibration', Measurement Science and Technology, 15, pp. 1337 - 1346, http://dx.doi.org/10.1088/0957-0233/15/7/016

Cumpson PJ; Hedley J, 2003, 'Accurate analytical measurements in the atomic force microscope: A microfabricated spring constant standard potentially traceable to the SI', Nanotechnology, 14, pp. 1279 - 1288, http://dx.doi.org/10.1088/0957-4484/14/12/009

Cumpson PJ; Hedley J; Zhdan P, 2003, 'Accurate force measurement in the atomic force microscope: A microfabricated array of reference springs for easy cantilever calibration', Nanotechnology, 14, pp. 918 - 924, http://dx.doi.org/10.1088/0957-4484/14/8/314

Perruchot C; Watts JF; Lowe C; White RG; Cumpson PJ, 2002, 'Angle-resolved XPS characterization of urea formaldehyde-epoxy systems', Surface and Interface Analysis, 33, pp. 869 - 878, http://dx.doi.org/10.1002/sia.1465

Lea C; Cumpson PJ, 2002, 'Preface', Surface and Interface Analysis, 33, pp. 176 - 177, http://dx.doi.org/10.1002/sia.1199

Cumpson PJ, 2001, 'Estimation of inelastic mean free paths for polymers and other organic materials: use of quantitative structure-property relationships', Surface and Interface Analysis, 31, pp. 23 - 34, http://dx.doi.org/10.1002/sia.948

Seah MP; Spencer SJ; Cumpson PJ; Johnstone JE, 2000, 'Sputter-induced cone and filament formation on InP and AFM tip shape determination', Surface and Interface Analysis, 29, pp. 782 - 790, http://dx.doi.org/10.1002/1096-9918(200011)29:11<782::AID-SIA929>3.0.CO;2-1

Cumpson PJ; Zalm PC, 2000, 'Thickogram: A method for easy film thickness measurement in XPS', Surface and Interface Analysis, 29, pp. 403 - 406, http://dx.doi.org/10.1002/1096-9918(200006)29:6<403::AID-SIA884>3.0.CO;2-8

Cumpson PJ, 1999, 'Angle-resolved XPS depth-profiling strategies', Applied Surface Science, 144-145, pp. 16 - 20, http://dx.doi.org/10.1016/S0169-4332(98)00752-1

Seah MP; Spencer SJ; Cumpson PJ; Johnstone JE, 1999, 'Cones formed during sputtering of InP and their use in defining AFM tip shapes', Applied Surface Science, 144-145, pp. 151 - 155, http://dx.doi.org/10.1016/S0169-4332(98)00794-6

Cumpson PJ; Spencer SJ; Seah MP, 1998, 'Calibration of Auger and X-ray photoelectron spectrometers for valid analytical measurements', Spectroscopy Europe, 10, pp. 8 - 14

Cumpson PJ; Seah MP, 1997, 'Elastic scattering corrections in AES and XPS. II. Estimating attenuation lengths and conditions required for their valid use in overlayer/substrate experiments', Surface and Interface Analysis, 25, pp. 430 - 446, http://dx.doi.org/10.1002/(SICI)1096-9918(199706)25:6<430::AID-SIA254>3.0.CO;2-7

Cumpson PJ, 1997, 'Elastic scattering corrections in AES and XPS. III. Behaviour of electron transport mean free path in solids for kinetic energies in the range 100 eV < e < 400 eV', Surface and Interface Analysis, 25, pp. 447 - 453, http://dx.doi.org/10.1002/(SICI)1096-9918(199706)25:6<447::AID-SIA272>3.0.CO;2-Q

Jackson AR; El Gomati MM; Matthew JAD; Cumpson PJ, 1997, 'Monte Carlo calculations of the depth distribution function in multilayered structures', Surface and Interface Analysis, 25, pp. 341 - 351, http://dx.doi.org/10.1002/(SICI)1096-9918(199705)25:5<341::AID-SIA242>3.0.CO;2-H

Cumpson PJ, 1997, 'Quartz crystal microbalance: A new design eliminates sensitivity outside the electrodes, often wrongly attributed to the electric fringing field', Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, 15, pp. 2407 - 2412, http://dx.doi.org/10.1116/1.580755

Cumpson PJ; Seah MP, 1996, 'Stability of reference masses IV: Growth of carbonaceous contamination on platinum-iridium alloy surfaces, and cleaning by UV/ozone treatment', Metrologia, 33, pp. 507 - 532, http://dx.doi.org/10.1088/0026-1394/33/6/1

Cumpson PJ; Seah MP; Spencer SJ, 1996, 'Simple procedure for precise peak maximum estimation for energy calibration in AES and XPS', Surface and Interface Analysis, 24, pp. 687 - 694, http://dx.doi.org/10.1002/(sici)1096-9918(19960930)24:10<687::aid-sia174>3.0.co;2-q

Cumpson PJ; Seah MP, 1995, 'Stability of reference masses III: Mechanism and long-term effects of mercury contamination on platinum-iridium mass standards', Metrologia, 31, pp. 375 - 388, http://dx.doi.org/10.1088/0026-1394/31/5/005

Cumpson PJ, 1995, 'Angle-resolved XPS and AES: Depth-resolution limits and a general comparison of properties of depth-profile reconstruction methods', Journal of Electron Spectroscopy and Related Phenomena, 73, pp. 25 - 52, http://dx.doi.org/10.1016/0368-2048(94)02270-4

Cumpson PJ; Seah MP, 1994, 'Stability of reference masses I: Evidence for possible variations in the mass of reference kilograms arising from mercury contamination', Metrologia, 31, pp. 21 - 26, http://dx.doi.org/10.1088/0026-1394/31/1/004

Seah MP; Qiu JH; Cumpson PJ; Castle JE, 1994, 'Stability of reference masses II: The effect of environment and cleaning methods on the surfaces of stainless steel and allied materials', Metrologia, 31, pp. 93 - 108, http://dx.doi.org/10.1088/0026-1394/31/2/002

Seah MP; Qiu JH; Cumpson PJ; Castle JE, 1994, 'Simple method of depth profiling (stratifying) contamination layers, illustrated by studies on stainless steel', Surface and Interface Analysis, 21, pp. 336 - 341, http://dx.doi.org/10.1002/sia.740210603

Seah MP; Cumpson PJ, 1993, 'Signal-to-noise ratio assessment and measurement in spectroscopies with particular reference to Auger and X-ray photoelectron spectroscopies', Journal of Electron Spectroscopy and Related Phenomena, 61, pp. 291 - 308, http://dx.doi.org/10.1016/0368-2048(93)80021-D

Cumpson PJ, 1993, 'Elastic scattering corrections in AES and XPS: I. Two rapid Monte Carlo methods for calculating the depth distribution function', Surface and Interface Analysis, 20, pp. 727 - 741, http://dx.doi.org/10.1002/sia.740200818

Seah MP; Cumpson PJ, 1992, 'Comment on 'spectral noise removal by digital filtering and its application to surface analysis' by K. Piyakis and E. Sacher', Applied Surface Science, 62, pp. 195 - 198, http://dx.doi.org/10.1016/0169-4332(92)90146-O

Cumpson PJ; Seah MP, 1992, 'Random uncertainties in AES and XPS: I: Uncertainties in peak energies, intensities and areas derived from peak synthesis', Surface and Interface Analysis, 18, pp. 345 - 360, http://dx.doi.org/10.1002/sia.740180508

Cumpson PJ; Seah MP, 1992, 'Random uncertainties in AES and XPS: II: Quantification using either relative or absolute measurements', Surface and Interface Analysis, 18, pp. 361 - 367, http://dx.doi.org/10.1002/sia.740180509

Cumpson PJ; Seah MP, 1990, 'The quartz crystal microbalance; radial/polar dependence of mass sensitivity both on and off the electrodes', Measurement Science and Technology, 1, pp. 544 - 555, http://dx.doi.org/10.1088/0957-0233/1/7/002

Conference Papers

Ebrahimzade N; Portoles J; Cumpson P; Wilkes M; Whalley RD, 2022, 'OPTICAL MEMS SENSORS FOR INSTANTANEOUS WALL-SHEAR STRESS MEASUREMENTS IN TURBULENT BOUNDARY-LAYER FLOWS', in 12th International Symposium on Turbulence and Shear Flow Phenomena, TSFP 2022

Wang J; Cumpson PJ, 2007, 'Modelling of angle-resolved X-ray photoelectron spectroscopy (ARXPS) intensity ratios for nanocharacterisation of closely packed shell-core nanofibres', in Proceedings of SPIE - The International Society for Optical Engineering, http://dx.doi.org/10.1117/12.732364

Hedley J; Burdess JS; Harris AJ; Gallacher BJ; McNeil CJ; Cumpson PJ; Enderling S, 2004, 'An optical 'workstation' for characterization and modification of MEMS', in Proceedings of SPIE - The International Society for Optical Engineering, pp. 244 - 252, http://dx.doi.org/10.1117/12.545596

Cumpson PJ; Hedley J, 2004, 'A microfabricated spring-constant calibration device for atomic force microscopy (AFM) potentially traceable to the SI', in CPEM Digest (Conference on Precision Electromagnetic Measurements), pp. 269 - 270, http://dx.doi.org/10.1109/CPEM.2004.305567

Milton MJT; Cumpson PJ, 2002, 'Nano-scale integrity and coherence of the SI', in CPEM Digest (Conference on Precision Electromagnetic Measurements), pp. 316

Conference Abstracts

Purvis G; van der Land C; Sano N; Cumpson P; Gray N, 2020, 'Combining morphological and organic geochemical evidence for investigating putative ichnofossils: A case study for an approach for the detection of fossilised life on Mars', in EGU General Assembly Conference Abstracts, presented at EGU General Assembly Conference, https://ui.adsabs.harvard.edu/abs/2020EGUGA..2222041P/abstract

Preprints

Purvis G; Johnson KL; Peacock C; Wegorzewski A; Sano N; Sheriff J; Cumpson P; Lopez-Capel E, 2022, Stable organic carbon formation accelerated by manganese oxide mineral reduction and the implications for the global carbon cycle, http://dx.doi.org/10.21203/rs.3.rs-2090070/v1

Sheriff J; Fletcher IW; Cumpson PJ, 2020, Computer-readable Image Markers for Automated Registration in Correlative Microscopy autoCRIM, http://dx.doi.org/10.48550/arxiv.2011.14949

Cumpson PJ; Jaskiewicz M; Kim W, 2017, Argon Cluster-Ion Sputter Yield: Molecular Dynamics Simulations on Silicon and an Equation for Estimating Total Sputter Yield, http://dx.doi.org/10.48550/arxiv.1710.00367

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