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Andresen SE; McCamey DR; Brenner R; Ahrens MA; Mitic M; Chan VC; Gauja E; Hudson FE; Ferguson AJ; Buehler TM; Reilly DJ; Clark RG; Dzurak A; Hamilton AR; Wellard CJ; Yang C; Hopf T; Mccallum J; Jamieson DN; Hollenberg LC; Hutchison WD; Huebl H; Brandt MS; Hollenberg , 2009, 'Measuring the Charge and Spin States of Electrons on Individual Dopant Atoms in Silicon', in Electron Spin Resonance and Related Phenomena in Low-Dimensional Structures, Springer, Germany, pp. 169 - 182,

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