By Professor Bram Hoex

Conference Papers

Hoex B; Schmidt J; van de Sanden MCM; Kessels WMM, 2008, 'CRYSTALLINE SILICON SURFACE PASSIVATION BY THE NEGATIVE-CHARGE-DIELECTRIC Al2O3', in PVSC: 2008 33RD IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE, VOLS 1-4, IEEE, CA, San Diego, pp. 1154 - +, presented at 33rd IEEE Photovoltaic Specialists Conference, CA, San Diego, 11 May 2008 - 16 May 2008, https://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000273995000253&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=891bb5ab6ba270e68a29b250adbe88d1

Benick J; Hoex B; Schultz O; Glunz SW, 2008, 'SURFACE PASSIVATION OF BORON DIFFUSED EMITTERS FOR HIGH EFFICIENCY SOLAR CELLS', in PVSC: 2008 33RD IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE, VOLS 1-4, IEEE, CA, San Diego, pp. 1163 - +, presented at 33rd IEEE Photovoltaic Specialists Conference, CA, San Diego, 11 May 2008 - 16 May 2008, https://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000273995000255&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=891bb5ab6ba270e68a29b250adbe88d1

Kessels WMM; Van Den Oever PJ; Gielis JJH; Hoex B; Van De Sanden MCM, 2006, 'A real-time study of the a-Si:H/c-Si interface formation using ellipsometry, infrared spectroscopy, and second harmonic generation', in Conference Record of the 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion, WCPEC-4, pp. 1616 - 1619, http://dx.doi.org/10.1109/WCPEC.2006.279796

Hoex B; Peeters FJJ; Creatore M; Bijker MD; Kessels WMM; Van De Sanden MCM, 2006, 'Good surface passivation of C-Si by high rate plasma deposited silicon oxide', in Conference Record of the 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion, WCPEC-4, pp. 1134 - 1137, http://dx.doi.org/10.1109/WCPEC.2006.279361

Hoex B; Peeters FJJ; Van Erven AJM; Bijker MD; Kessels WMM; Van De Sanden MCM, 2006, 'High-quality surface passivation obtained by high-rate deposited silicon nitride, silicon dioxide and amorphous silicon using the versatile expanding thermal plasma technique', in Conference Record of the 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion, WCPEC-4, pp. 1036 - 1039, http://dx.doi.org/10.1109/WCPEC.2006.279296

Van De Sanden MCM; Creatore M; Blauw MA; Hoefnagels JPM; Hoex B; Van Den Oever PJ; Smets AHM; Schram DC; Kessels WMM, 2005, 'Expanding thermal plasma CVD: Experimental studies of the plasma-surface interaction', in Proceedings - Electrochemical Society, pp. 36 - 48

Kessels WMM; Van Den Oever PJ; Hoex B; Bosch RCM; Van Erven AJM; Bijker MD; Van De Sanden MCM, 2005, 'Controlling the silicon nitride film dENSfTY for ultrahigh-rate deposition of top quality antireflection coatings', in Conference Record of the IEEE Photovoltaic Specialists Conference, pp. 1253 - 1256

Van Den Oever PJ; Kessels WMM; Hoex B; Bosch RCM; Van Erven AJM; Pennings RLJR; Stals WTM; Bijker MD; Van De Sanden MCM, 2005, 'Plasma properties of a novel commercial plasma source for high-throughput processing of c-Si solar cells', in Conference Record of the IEEE Photovoltaic Specialists Conference, pp. 1320 - 1323

Aarts IMP; Hoex B; Gielis JJH; Leewis CM; Smets AHM; Engeln R; Nesládek M; Kessels WMM; Van de Sanden MCM, 2003, 'Thin film cavity ringdown spectroscopy and second harmonic generation on thin a-Si:H films', in Materials Research Society Symposium - Proceedings, pp. 111 - 116, http://dx.doi.org/10.1557/proc-762-a19.8

Conference Posters

Varshney U; Liu S; Chen D; Kim M; Abbott M; Payne D; Hoex B; Chan C; Wenham S; Sen C, 2018, 'Influence of dielectric passivation layer thickness on LeTID in multicrystalline silicon', Hawaii, USA, Vol. 00, pp. 363 - 367, presented at WCPEC-7, Hawaii, USA, 10 June 2018 - 15 June 2018, http://dx.doi.org/10.1109/PVSC.2018.8547618

Conference Presentations

Sen C; Wang H; Wu X; Khan MU; Chan C; Hoex B, 2023, 'Hidden Fingerprints: How Solar Cell Handling Leads to Damp Heat Failures in Silicon Heterojunction Technology', presented at PVSEC-34 -International Photovoltaic Science and Engineering Conference, Shenzhen, China, 06 November 2023 - 10 November 2023, https://www.pvsec-34.com/

Sen C; Wang H; Wu X; Khan MU; Mao L; Jiang F; Zhang G; Chan C; Hoex B, 2023, 'Al2O3 Barrier Layers: A Novel Approach to Preventing Humidity-Induced Failure in Heterojunction', presented at 40th EU PVSEC Conference and Exhibition, Lisbon, Portugal, 18 September 2023 - 22 September 2023, https://www.eupvsec.org/index.php/conference/conference

Hallam B; Chen D; Kim M; Vicari Stefani B; Hamer P; Holman Z; Shi J; Abbott MD; Chan CE; Hoex B; Wenham S, 2017, 'The roles of defects, gettering and hydrogenation for next generation silicon solar cells: An industrial perspective', presented at 17th Gettering and Defect Engineering in Semiconductor Technology Conference, George, USA, 01 October 2017 - 06 October 2017

Conference Abstracts

Halilov S; Belayneh M; Hossain MA; Hoex B; Abdallah A; Rashkeev SN, 2020, 'Graded NixAlyO hole transport layer in silicon solar cells', in 2020 47TH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), IEEE, ELECTR NETWORK, pp. 696 - 698, presented at 47th IEEE Photovoltaic Specialists Conference (PVSC), ELECTR NETWORK, 15 June 2020 - 21 August 2020

Preprints

Wan Y; Ajith A; Liu Y; Lu K; Grazian C; Hoex B; Zhang W; Kit C; Xie T; Foster I, 2024, SciQAG: A Framework for Auto-Generated Scientific Question Answering Dataset with Fine-grained Evaluation, , http://dx.doi.org/10.48550/arxiv.2405.09939

Xie T; Wan Y; Huang W; Yin Z; Liu Y; Wang S; Linghu Q; Kit C; Grazian C; Zhang W; Razzak I; Hoex B, 2023, DARWIN Series: Domain Specific Large Language Models for Natural Science, , http://dx.doi.org/10.48550/arxiv.2308.13565

Xie T; Wan Y; Huang W; Zhou Y; Liu Y; Linghu Q; Wang S; Kit C; Grazian C; Zhang W; Hoex B, 2023, Large Language Models as Master Key: Unlocking the Secrets of Materials Science with GPT, , http://dx.doi.org/10.48550/arxiv.2304.02213

Xie T; Wan Y; Li W; Linghu Q; Wang S; Cai Y; Liu H; Kit C; Grazian C; Hoex B, 2022, Interdisciplinary Discovery of Nanomaterials Based on Convolutional Neural Networks, , http://dx.doi.org/10.48550/arxiv.2212.02805

Madumelu C; Cai Y; Hollemann C; Peibst R; Hoex B; Hallam B; Soeriyadi A, Assessing the Stability of P+ and N+ Polysilicon Passivating Contacts with Various Capping Layers on P-Type Wafers, , http://dx.doi.org/10.2139/ssrn.4289694

Sen C; Wang H; Wu X; Khan MU; Chan C; Abbott M; Hoex B, Four Failure Modes in Silicon Heterojunction Glass-Backsheet Modules, , http://dx.doi.org/10.2139/ssrn.4293027

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